The medium active area 60 mm2 chip mounted in a slim-line detector finger provides a large solid angle and high take-off angle. The XFlash® 6T-60 is therefore ideal for applications with relatively low X-ray yield, for instance for atomic resolution spectrometry, experiments where a zone axis must be kept and the sample can therefore not be tilted, and beam sensitive specimens (e.g. graphene, life science). The detector also delivers very good energy resolution with 126 eV at Mn Kα.
In summary, the XFlash® 6T-60 offers the following advantages:
Suggested areas of application for the XFlash® 6T-60 are: