The medium active area 60 mm2 chip mounted in a slim-line detector finger provides a large solid angle and high take-off angle. The XFlash® 6T-60 is therefore ideal for applications with relatively low X-ray yield, for instance for atomic resolution spectrometry, experiments where a zone axis must be kept and the sample cannot be tilted, and for beam-sensitive specimens (e.g. graphene, life science). The detector also delivers very good energy resolution with 126 eV at Mn Kα.
In summary, the XFlash® 6T-60 offers the following advantages:
Suggested areas of application for the XFlash® 6T-60 are: