Crystalline structures regularly cause diffraction peaks when analyzed with X-rays. X-ray Diffractometry (XRD) is the method of choice for characterizing crystals and identifying their orientation. The setup of the M4 TORNADO micro-XRF spectrometer (focused polychromatic X-ray beam, large solid angle of detection) makes the detection of diffraction peaks (Bragg peaks) very likely but makes their quantitative analysis difficult. Purely qualitative analysis; for example seeing the positions, sizes of, and borders between, crystal domains already tells a lot about the samples.
There is no quicker way to show qualitative changes in diffraction patterns over such large sample areas with this spatial resolution than with the M4/M6 technology.