AFM Modes

Nanomanipulation

Manipulation, modification, or fabrication of nanometer-scale structures using an AFM

Through a set of nanomanipulation operating modes, AFM can also be applied for precise manipulation, modification, or fabrication of nanometer‑scale structures. Most nanomanipulation methods make use of precise force control to alternate between imaging the sample and modifying it. A nanomanipulation experiment typically consists of a series of alternating imaging and modification steps using the same tip.

During nanomanipulation operation, the tip follows a user‑defined path created by a series of user‑selected positions, vector files, or scripts. While following the path, the operating mode (contact mode or TappingMode) and related tip‑sample force interactions are precisely controlled to manipulate local sample features. Additional control of voltages can also be applied. Manipulation is typically followed by an imaging step (using the same probe) of the modified area.

Nanomanipulation is typically applied to move nanoparticles, nanowires, and other nanoscale objects that are loosely bound to the surface. A semiconductor industrial application for nanomanipulation is defect removal on EUV photomasks.

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Height images during manipulation of (clockwise from top left) carbon nanotubes, Au nanoparticles, carbon nanotubes, and polymer macromolecule on HOPG. Scan sizes (X): 2 μm, 2 μm, 900 nm, 500 nm.

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The Definitive AFM Modes Handbook contains everything you need to understand, select, and apply AFM techniques in materials research, including:

An easy-to-use framework for understanding the seven categories of AFM modes, their capabilities, and their core uses

Detailed descriptions of 50+ modes and variants (including 300+ data images)
Summary information about what each mode is, how it works, and when to use it

Our experts' top probe recommendations for each mode

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AFM Modes

AFM modes and the broad capabilities from AFM beyond imaging