XRF Basics and Sample Preparation for EDXRF and WDXRF Equipment

To improve the theoretical and practical knowledge related to elemental chemical analysis using EDXRF and WDXRF for BRUKER users and non-users, regardless of their experience with these analytical techniques.

Instructor
Eng. Cristian Roque Perdoná – Bruker Application Coordinator BAXS - LATAM.

Duration
32 hours, 100% in-person 

Training Plan

Module I (Theoretical) - 8 hours

• Fundamentals: The electromagnetic spectrum, X-ray theory;
• Types of equipment: wavelength dispersion X-ray fluorescence spectrometry (WDXRF) and energy dispersive X-ray fluorescence spectrometry (EDXRF).
• Instrumental parameters:
  -    X-ray tubes – Voltage and current ratio;
  -    Analyzer crystals;
  -    Collimators;
  -    Detectors;
  -    Filters;

• Quality of results: sensitivity vs. accuracy;
• Analytical interferences;
• Matrix effect correction: Fixed Alpha x Variable Alpha;
• Correction overlaps;
• Drift correction;
• Sample preparation methods;

Module II (Practical) - 24 hours

• Sample preparation by pressing, fusion, and liquid preparation;
• Construction of analytical curves and application of SPECTRA plus and SPECTRA.ELEMENTS software resources;
• Semi-quantitative analysis and interpretation of results from SMART-QUANT and QuantExpress methods;
• Step-by-step construction of quantitative analytical curves and application of Spectra.Elements and SPECTRA Plus software resources;
• Definition of analytical lines - voltage, current, filters, crystals, collimators, and detectors;
• Calibration of EDXRF and  WDXRF equipment - linear regression and linearization tools;
• Definition of control routines and method verification.

Dates:

• July 20 – 24, 2026
  Portuguese | on‑site in Atibaia
  

• October 05 – 10, 2026
  Spanish | on‑site in Atibaia
  

Location: