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Expansion of 3D Optical Profiler to Wide Field and Rough Samples

Learn when and why to use Focus Variation for 3D surface topography measurement and how it extends the capabilities of 3D optical profilers
Presented by Samuel Lesko, Ph.D., Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (November 11, 2018)


  • [00:02:45] The principles of Focus Variation
  • [00:08:58] Why Focus Variation is ideal for widefield and rough surfaces
  • [00:17:55] Considerations for choosing Focus Variation vs other measurement solutions
  • [00:21:54] Tribology case studies
  • [00:25:58] Corrosion Testing case studies
  • [00:29:40] Aesthetic and Perception assessment case studies
  • [00:36:00] Additive Manufacturing and 3D Printing case studies


  • [00:48:26] Can both WLI and Focus Variation techniques be performed on the same platform?
  • [00:49:39] How does the vertical resolution of Focus Variation compare to that of WLI?
  • [00:51:53] What is the maximum angle it is possible to measure via Focus Variation?
  • [00:53:02] What is the difference between Focus Variation and WLI for measuring roughness?