Micro-XRF Spectrometers

M1 MISTRAL

Compact Benchtop micro-XRF Spectrometer

Bulk Material & Coatings

Cost-Efficient Operation

M1 MISTRAL Micro-XRF

하이라이트

100 µm
Minimum spot size
Can even resolve fine structure details on circuit boards
2 nm-60 µm
Thickness range for analysis of multiple multi-element-layers
Challenging analysis of layer thickness and composition according to ASTM B568 and ISO 3497; including layers with repeating elements; programmable multipoint analysis
8 ppm
Limits of detection for Cu, Zn in polymers or Pb in Zn
RoHS screening, analysis of trace elements in solders, plastics, metal alloys; automatic correction on the material thickness, exact measurement spot positioning on PCB components

A Compact Multi-Purpose Benchtop micro-XRF Spectrometer

Key factors

  • Flexible instrument 
  • Easy to operate
  • User-friendly touch screen interface
  • Access to raw data

M1 MISTRAL is a compact benchtop energy dispersive micro-XRF analyzer for multi-purpose use.  Easy to operate and designed for fast and cost-efficient operation in an industrial environment, M1 MISTRAL provides accurate information on the elemental composition and layer thickness of materials such as precious metal alloys as well as for multi-layer structures.

Bulk and coatings are analyzed according to ASTM standard B568 and to European norm ISO 3497. High accuracy can be achieved in the analysis of electroless deposited nickel phosphate (NiP) coatings with excitation through a Rh target. 

The exact composition of all jewelry alloys, platinum group metals, or silver can be determined in a fraction of a minute. Results can be output either in weight-% or in carat. 

The analysis can be performed standardless or standard-based to reach even higher levels of accuracy. A great variaty of calibrations is available for each application.

From positioning the sample to printing the results in a report - the full workflow is integrated in the software. At the same time full transperency is guaranteed with the open access to the raw data.

혜택

Benefits of the M1 MISTRAL

A wide variety of elements can be measured non destructively. No sample preparation is required. Even complex analytical tasks can be automated with the programmable XYZ stage and started with a single mouse click. Ultra-fast detection systems provide quick results. 

The M1 MISTRAL comes with a large area silicon drift detector (SDD) with superior count rate performance and energy resolution to drive detection limits down to the ppm level. High performance detector, digital pulse processing and optimized geometrical conditions result in a highly efficient X-ray detection and therefore fast and accurate analysis results.

The easy-to-use and maintenance-free design of the M1 MISTRAL and the powerful analytical software suite permit operation even by personnel who have received only brief training. No consumables or gases are required. Sturdy construction ensures highest stability and maintenance-free operation.

사양

Technical details

Excitation

  • High performance micro focus tube with W or Rh target    
Max. sample size & weight
  • 48x49x20 cm³
  • up to 1.8 kg

Detector

  • Peltier cooled, 30 mm² high performance silicon drift detector, <150 eV energy resolution at Mn Ka            
Maxi. stage travel range 
  • Up to 200 mm x 175 mm x 80 mm (for motorized XYZ stage with auto focus and EasyLoad function)

Wide range of elements

  • Default: from Ti (Z=22) with W target 
  • Optional: from Al (Z=13) with Rh target                      
Instrument dimensions (W x D x H)
  • 550 mm x 680 mm x 430 mm
X-ray spot size
  • Collimator changer for 0.1 mm to 1.5 mm              
   

소프트웨어

XSpect Pro Analytical Software Suite

  • Instrument control, data acquisition and management
  • User selectable touch screen interface 
  • Stage control and programming 
  • Analysis of metallic multi-layers regarding layer thickness and composition
  • Quantitative composition analysis, standardless and standard-based empirical models
  • Spectrum viewer with automatic peak identification
  • Statistical process control (SPC) trendline and data
  • Report generator
  • Result archive