Knowledge Pack: Thin Film Characterization with AFM-IR

Webinar: Deconvoluting Infrared Spectra from Stacked Films using Surface Sensitive AFM-IR

^{RESOURCE TYPE: Video (part of Surface Characterization of Thin Films & Coatings Symposium; full on-demand access with knowledge pack)
LENGTH: ~20 minutes}

^DESCRIPTION:
In this webinar segment, Bruker application specialists explain the fundamentals of photothermal AFM-IR as an extension of atomic force microscopy in the context of nanoscale thin film characterization.

The segment introduces the addition of a tunable infrared laser and the mechanism of absorption-induced thermal expansion detected by the AFM cantilever. It frames why AFM-IR is used for heterogeneous and multilayer systems, including examples relevant to thin films. This provides the conceptual basis for evaluating AFM-IR as a surface-sensitive chemical analysis method.

_{VIEWERS WILL LEARN:}

• What photothermal AFM-IR is and how it extends conventional AFM
• Why nanoscale chemical identification is needed in thin film systems
• What mechanism enables IR absorption to be measured at the nanoscale
• How AFM-IR distinguishes chemical variation across layered materials
• Why surface-sensitive analysis is important for heterogeneous films

Application Note: Advantages of Photothermal AFM-IR for Polymer Research

^{RESOURCE TYPE: Application Note [PDF]
LENGTH: 7 pages}

^DESCRIPTION:
This application note explores the advantages of photothermal AFM-IR for characterizing polymer systems, including examples applicable to thin films. It explains how nanoscale spatial resolution, tunable infrared excitation, and surface-sensitive detection overcome limitations of conventional IR techniques. The document highlights why AFM-IR is selected when chemical variation at small length scales must be resolved. This supports evaluation of the method in comparison to bulk or diffraction-limited approaches.

_{READERS WILL LEARN:}

• What advantages AFM-IR provides over conventional IR techniques
• Why nanoscale resolution matters for chemical mapping in thin films
• How surface-sensitive detection avoids thickness-related artifacts
• When AFM-IR is chosen for heterogeneous polymer systems
• Why tunable IR excitation improves chemical specificity

Webinar: Chemical Characterization of Heterogenous Polymeric Materials on the Nanoscale Using Photothermal AFM-IR

^{RESOURCE TYPE: Webinar
LENGTH: ~1 hour}

^DESCRIPTION:
Bruker experts discuss the application of photothermal AFM-IR across a range of heterogeneous polymer materials, including systems relevant to thin films.

The webinar highlights use cases such as polymer blends, multilayer structures, and organic photovoltaic materials, showing how nanoscale chemical mapping reveals compositional variation. It emphasizes versatility in measuring domains, interfaces, and phase-separated structures. This demonstrates how AFM-IR can be applied across different material systems and configurations.

_{VIEWERS WILL LEARN:}

• Where AFM-IR can be applied across polymer and thin film systems
• What chemical properties can be measured in heterogeneous materials
• How nanoscale mapping reveals domains and compositional variation
• Why AFM-IR is suitable for multilayer and blended structures
• When to apply AFM-IR for different material architectures

Application Note: Chemical Characterization of Polymeric Films, Blends, and Self-Assembled Monomers

^{RESOURCE TYPE: Application Note [PDF]
LENGTH: 4 pages}

^DESCRIPTION:
This application note explores chemical characterization of polymeric films, blends, and self-assembled monomers using AFM-IR. It provides examples of how nanoscale IR absorption mapping is used to distinguish chemical domains and phase-separated regions. The document reinforces the versatility of AFM-IR for different material systems, including thin film applications. It supports evaluation by showing consistent performance across multiple polymer structures.

_{READERS WILL LEARN:}

• What types of polymer systems can be analyzed with AFM-IR
• How chemical domains are identified in thin films and blends
• Why nanoscale IR mapping is needed for heterogeneous materials
• When AFM-IR is applied to self-assembled structures
• What measurement outcomes reveal compositional variation

Application Note: Photothermal AFM-IR for Semiconductor Materials and Devices

^{RESOURCE TYPE: Application Note [PDF]
LENGTH: 5 pages}

^DESCRIPTION:
This application note examines the use of AFM-IR for semiconductor materials and devices, including thin film structures and interfaces. It focuses on identifying chemical composition at interfaces, detecting contamination, and understanding layer-specific properties. The examples show how nanoscale IR mapping is applied to real device-related challenges. This connects the method directly to specific technical problems in thin film systems.

_{READERS WILL LEARN:}

• What semiconductor thin film problems AFM-IR can address
• How interface chemistry is analyzed at the nanoscale
• Why chemical identification is critical for device performance
• How AFM-IR is applied to contamination and defect analysis
• When nanoscale chemical mapping is required in devices

Application Note: High-Resolution Chemical Imaging with Tapping AFM-IR

^{RESOURCE TYPE: Application Note [PDF]
LENGTH: 4 pages}

^DESCRIPTION:
This application note explores tapping mode AFM-IR for analyzing soft or fragile materials, including thin film coatings and polymer systems. It explains how tapping operation reduces sample damage while maintaining chemical sensitivity. The document highlights use cases where conventional contact modes are not suitable. This supports evaluation of AFM-IR for challenging sample types.

_{READERS WILL LEARN:}

• What tapping AFM-IR is and when it is used
• Why fragile thin films require non-destructive measurement modes
• How tapping mode preserves sample integrity
• When to select tapping mode over contact approaches
• What types of materials benefit from this configuration

Demo: Epoxy Film with PMMA/PS Beads and Carbon Black 

^{RESOURCE TYPE: Real-time technical demonstration
LENGTH: ~10 minutes}

^DESCRIPTION:
Bruker application specialists demonstrate a NanoIR workflow using a heterogeneous epoxy thin film containing PMMA and polystyrene beads. The demo shows how specific IR wavelengths are selected to probe chemical features and how photothermal signals are interpreted. It also illustrates correlation with mechanical measurements to distinguish materials with similar properties. This provides practical guidance on performing and interpreting AFM-IR measurements.

_{VIEWERS WILL LEARN:}

• How to perform AFM-IR measurements on heterogeneous thin films
• How to select IR wavelengths for specific chemical identification
• How to interpret photothermal response signals
• What happens when materials have similar mechanical properties but different chemistry
• When to use correlative workflows combining chemical and mechanical data