Optical Tweezers Resource Library

(De-)Multiplexing: Multi-Trap Force Measurements and Sample Manipulation with JPK’s NanoTracker 2

Learn how the NanoTracker enables real-time data analysis and signal-separated force measurements of complex nanoscale systems

 Optical Tweezers; NanoTracker; Force Measurements; Multiplexing; Viscous Drag Measurements; Nanomanipulation; Life Science

Trap multiplexing in the time-sharing mode of Bruker’s NanoTracker 2 relies on ultra-fast high precision beam steering and further expands the range of possible trap configurations for a multitude of applications. Trap stiffness values can be adjusted for each trap individually by the user through the convenient dwell time set function integrated in the NanoTracker 2 control software. All multiplexed traps can be positioned independently or arranged in complex patterns stored in custom configuration files. This freedom in configuring and dynamically rearranging tens to hundreds of parallel traps enables users to perform complex manipulations of microscopic objects.

The new de-multiplexing feature is based on quick and reliable real-time data analysis and allows separating the signals from up to eight parallel traps. The isolated signals can be used for the subsequent calibration of detection sensitivity and trap stiffness which in turn in the prerequisite for high resolution displacement and force measurements. This unique combination of precision and flexibility will enable researchers to gain more detailed insight into the interactions of complex nanoscale systems.

Readers can expect to learn about:

  • The principle of force measurements and trapping with Optical Tweezers;
  • The challenges of (de-)multiplexing, and calibration methods such as viscous drag measurements showcasing the outstanding flexibility and precision of Bruker's NanoTracker system; and
  • The benefits and potential of the new de-multiplexing feature for investigating complex nanoscale systems.