BIG SKY, Montana (USA) – July 31st, 2017 – At the 66th annual Denver X-ray Conference, Bruker announces the availability of the LYNXEYE XE-T next generation one-dimensional compound silicon strip detector, further enhancing the performance of its popular D2 PHASERTM benchtop X-ray diffraction (XRD) system.
The versatile hardware of the updated D2 PHASER combined with the Bruker DIFFRAC.SUITETM software allows users the flexibility to create automated push-button methods for ease of use and to customize measurement conditions and configurations for optimized data quality. This benchtop system needs no water cooling or special power requirements, making the D2 PHASERunmatched in its ability to bring powder XRD to any laboratory.
The LYNXEYE XE-T detector features four times better energy resolution than traditional silicon strip detectors in order to efficiently remove unwanted radiation, such as fluorescence, K-beta radiation, and bremsstrahlung background, without meaningful losses in one-dimensional detection speed.
According to Arnt Kern, the Bruker AXS Product Line Manager for XRD: “The D2 PHASER with LYNXEYE XE-T sets a new standard for benchtop-class high-speed data collection, outstanding peak to background ratio, and data quality.”
For more than 55 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker's high-performance scientific research instruments and high-value analytical and diagnostic solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.
In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics.