Quantifying Historic Pesticide Residues on Collections: Practical Approaches with micro-XRF
Quantifying Historic Pesticide Residues on Collections: Practical Approaches with micro-XRF
In Cooperation with HITACHI

Optimized Elemental Analysis with Tabletop Electron Microscopes

This Webinar takes place on January 22, 2026

Session I: 22, January 2026

  • 10:00 CET / Berlin
  • 17:00 SGT / Singapore
  • 18:00 JST / Tokyo

Session II: 22, January 2026

  • 17:00 CET / Berlin
  • 08:00 PST / Los Angeles
  • 11:00 EST / New York

IN COOPERATION WITH

Register for the Webinar Now 

Thank you for your Registration

Thank you for registering - you will shortly recieve details to join the session. If you registered for Upfront On Demand you will be sent the webinar recording and slides following the webinar broadcast.  

If there is anything else that we can help with please contact info.ema@bruker.com

In the meantime, please take a look at our other EDS webinars using the link to the right. 

 

What to Expect

Recently, Hitachi’s TM4000PlusⅢ microscopes and Bruker’s QUANTAX EDS system have undergone significant improvements to allow high-throughput elemental analyses (QUANTAX 75-60). In this webinar, in collaboration with Hitachi, we will demonstrate that EDS analyses once limited to high-end systems are now reproducible with a compact and user-friendly SEM.

With the introduction of the new TM4000PlusⅢ tabletop electron microscopes higher probe currents have become available which allows for even higher EDS productivity. 

Bruker’s QUANTAX EDS solution now maximizes analytical throughput with high beam currents. The latest ESPRIT Compact software includes the LiveMap function to identify regions of interest in real time and improve workflow efficiency.

To the end user, these new changes translate to enhanced intuitiveness and substantially improved acquisition speed and data quality, allowing challenging samples to be analyzed in a few minutes (e.g., beam-sensitive, with high topography or containing lots of chemical elements).

During the webinar the new features of the TM4000PlusⅢSEMs will be presented, higher probe current, filament indicator, probe current monitor as well as new no-code/low-code automation tools. Powerful tools that can make the compact SEM do complex automated tasks similar to a large full-scale system.  

Achieve high-quality elemental mapping of diverse materials in less than 5 minutes (like battery, powders, alloys, mineralogy).

Effortlessly identify and quantify small particles and heterogeneities in complex or embedded samples.

 

Who should attend?

  • Microscopists and laboratory managers interested in facilitating and expanding routine analytical capabilities.
  • Academic and industry researchers in materials science, metallurgy, geology, and battery research seeking efficient microanalytical workflows.
Hitachi’s TM4000PlusⅢ microscopes
EDS map - Bruker's QUANTAX 75-60

Speakers

Jürgen Simon

 

Sales Manager, Hitachi High-Tech Europe

Julien Aubourg

 

Application Scientist EDS, Bruker Electron Microscope Analyzers