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Brochures & Datasheets

Dimension Icon - Brochure 1.4MB
Bruker’s Dimension Icon® Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry.


Dimension Icon SSRM - Datasheet 1.0MB
Bruker’s Dimension Icon SSRM-HR AFM configuration extends the spatial resolution and repeatability of scanning spreading resistance microscopy (SSRM) carrier profiling to address the stringent needs of current and future ITRS technology nodes.


ScanAsyst Imaging Mode - Brochure 2.0MB
The world’s first imaging mode with automatic image optimization technology for atomic force microscopy (AFM). This patent-pending innovation frees researchers from the task of adjusting scan parameters, such as setpoint, feedback gains, and scan rate.


PeackForce QNM - Brochure 586kB
PeakForce Quantitative Nanomechanical Property Mapping is a groundbreaking imaging mode that provides AFM researchers unprecedented capability to quantitatively characterize nanoscale materials.


• AutoMet AFM Software - Datasheet 1.6MB

Bruker’s AutoMET™ software brings high-volume, precise AFM measurements to demanding production environments. Available for Dimension FastScan® and Dimension Icon® systems, AutoMET uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology.


Electrochemistry ECAFM Research Solutions - Datasheet 1.6MB



 PeakForce SECM - Brochure

Bruker’s exclusive PeakForce SECM™ mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM) with a spatial resolution less than 100 nanometers.

This application note provides an introduction of sMIM and its integration with Bruker’s versatile AFM platforms, such as the Dimension Icon® and Dimension Edge™ AFMs.

Bruker’s exclusive PeakForce Tapping® is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode™. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

Application Notes

 Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.27MB

Contact Resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals.  FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.

• PeakForce SECM - AN147  1.64MB

This application note discusses PeakForce SECM™, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.

PeakForce Kelvin Probe Force Microscopy - AN140 3.5MB
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive AFM, have been recognized as the two most used nanoscale electrical characterization tools, complementing each other.

Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM - AN 128 1.3MB
The scanning probe microscope (SPM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with the release of PeakForce QNM®, it is possible to identify material variations unambiguously and at high resolution across a topographic image. This application note discusses the principles and benefits of the PeakForce QNM imaging mode.

Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA - AN132 6.7MB
This application note discusses the basics of PeakForce TUNA, compares it to standard Contact Mode–based TUNA, and provides data demonstrating the unique capabilities and differentiated applications enabled through the combination of PeakForce Tapping and AFM conductivity measurement.

Introduction to Bruker's ScanAsyst and PeakForce Tapping Atomic Force Microscopy Technology - AN133 4.9MB
PeakForce Tapping™ and ScanAsyst™ are two Atomic Force Microsocope (AFM) imaging techniques for Bruker's atomic force microscopes. In this application note we will explain the underlying physical background, fit PFT into the framework of existing AFM modes, and show the benefits of these new modes through application examples.