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Brochures & Datasheets

Dimension Icon - Brochure 1.4MB
Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry.

PeakForce Tapping - Brochure 2.7MB
Bruker’s exclusive PeakForce Tapping is the most significant scientific breakthrough in atomic force microscope (AFM) technology since the introduction of TappingMode. It provides unprecedented high resolution imaging, extends AFM measurements into a range of samples not previously accessed and uniquely enables simultaneous nanoscale property mapping.

 PeakForce SECM - Brochure 2.2MB
Bruker’s exclusive PeakForce SECM mode is the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy (SECM) with a spatial resolution less than 100 nanometers.

• Dimension Icon SSRM - Datasheet 1.0MB
Bruker’s Dimension Icon SSRM-HR AFM configuration extends the spatial resolution and repeatability of scanning spreading resistance microscopy (SSRM) carrier profiling to address the stringent needs of current and future ITRS technology nodes. 

• AutoMet AFM Software - Datasheet 1.6MB
Bruker’s AutoMET software brings high-volume, precise AFM measurements to demanding production environments. Available for Dimension FastScan and Dimension Icon systems, AutoMET uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology.

• Electrochemistry ECAFM Research Solutions - Datasheet 1.6MB
Bruker’s closed electrochemical cells enable a wide range of new electrochemical atomic force microscopy (ECAFM) research.

 

 

Application Notes

Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.3MB
Contact resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals. FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.

An Introduction to AFM-Based Scanning Electrochemical Microscopy: PeakForce SECM - AN1471.6MB
This application note discusses PeakForce SECM, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.

Nanoscale Mapping of Permittivity and Conductivity with Scanning Microwave Impedance Microscopy - AN1461.9MB
This application note provides an introduction of sMIM and its integration with Bruker’s versatile AFM Dimension AFMs.

PeakForce Kelvin Probe Force Microscopy - AN140 3.5MB
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive AFM, have been recognized as the two most used nanoscale electrical characterization tools, complementing each other.

Introduction to Bruker's ScanAsyst and PeakForce Tapping Atomic Force Microscopy Technology - AN133 4.9MB
PeakForce Tapping and ScanAsyst are two atomic force microscopy imaging techniques for Bruker's AFMs. This application note explains the underlying physical background, fits PeakForce Tapping into the framework of existing AFM modes, and shows the benefits of these new modes through application examples.

Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA - AN132 6.7MB
This application note discusses the basics of PeakForce TUNA, compares it to standard contact mode–based TUNA, and provides data demonstrating the unique capabilities and differentiated applications enabled through the combination of PeakForce Tapping and AFM conductivity measurements.

Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM - AN 128 1.3MB
Until recently, the scanning probe microscope has not been able to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number of recent mode innovations have taken aim at these limitations, and now, with PeakForce QNM, it is possible to identify material variations unambiguously and at high resolution across a topographic image.