• Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.27MB
Contact Resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals. FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.
• PeakForce SECM - AN147 1.64MB
This application note discusses PeakForce SECM™, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.
• PeakForce Kelvin Probe Force Microscopy - AN140 3.5MB
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive AFM, have been recognized as the two most used nanoscale electrical characterization tools, complementing each other.
• Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM - AN 128 1.3MB
The scanning probe microscope (SPM) has long been recognized as a useful tool for measuring mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with the release of PeakForce QNM®, it is possible to identify material variations unambiguously and at high resolution across a topographic image. This application note discusses the principles and benefits of the PeakForce QNM imaging mode.
• Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA - AN132 6.7MB
This application note discusses the basics of PeakForce TUNA, compares it to standard Contact Mode–based TUNA, and provides data demonstrating the unique capabilities and differentiated applications enabled through the combination of PeakForce Tapping and AFM conductivity measurement.
• Introduction to Bruker's ScanAsyst and PeakForce Tapping Atomic Force Microscopy Technology - AN133 4.9MB
PeakForce Tapping™ and ScanAsyst™ are two Atomic Force Microsocope (AFM) imaging techniques for Bruker's atomic force microscopes. In this application note we will explain the underlying physical background, fit PFT into the framework of existing AFM modes, and show the benefits of these new modes through application examples.