• Performing Hyperspectral Mapping with AFM DataCube Nanoelectrical Modes - AN152 5.4MB
DCUBE modes provide simultaneous capture of nanometer-scale electrical and mechanical characteristics in high-density data cubes. For materials scientists and engineers, this breaks long-standing efficiency and characterization barriers.
• Quantitative Measurements of Elastic and Viscoelastic Properties with FASTForce Volume CR - AN148 3.3MB
Contact resonance captures both elastic and viscoelastic properties including storage modulus, loss modulus, and loss tangent for materials from soft polymers to metals. FASTForce Volume CR uniquely exploits AC force volume mapping to offer over 15 different mechanical data channels including adhesion without tip wear or sample damage.
• An Introduction to AFM-Based Scanning Electrochemical Microscopy: PeakForce SECM - AN147 1.6MB
This application note discusses PeakForce SECM, the world’s first complete commercial solution for AFM-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution.
• Nanoscale Mapping of Permittivity and Conductivity with Scanning Microwave Impedance Microscopy - AN146 1.9MB
This application note provides an introduction of sMIM and its integration with Bruker’s versatile AFM Dimension AFMs.
• PeakForce Kelvin Probe Force Microscopy - AN140 3.5MB
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys, photovoltaic effects on solar cells, and surface analysis. KPFM, together with conductive AFM, have been recognized as the two most used nanoscale electrical characterization tools, complementing each other.
• Introduction to Bruker's ScanAsyst and PeakForce Tapping Atomic Force Microscopy Technology - AN133 4.9MB
PeakForce Tapping and ScanAsyst are two atomic force microscopy imaging techniques for Bruker's AFMs. This application note explains the underlying physical background, fits PeakForce Tapping into the framework of existing AFM modes, and shows the benefits of these new modes through application examples.
• Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA - AN132 6.7MB
This application note discusses the basics of PeakForce TUNA, compares it to standard contact mode–based TUNA, and provides data demonstrating the unique capabilities and differentiated applications enabled through the combination of PeakForce Tapping and AFM conductivity measurements.
• Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM - AN 128 1.3MB
Until recently, the scanning probe microscope has not been able to achieve truly quantitative material property mapping with the resolution and convenience demanded by AFM researchers. A number of recent mode innovations have taken aim at these limitations, and now, with PeakForce QNM, it is possible to identify material variations unambiguously and at high resolution across a topographic image.