Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.
Ultimate Performance
- Proprietary sensor design achieves closed-loop performance with noise levels previously unseen on any AFM
- Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution
- Drift rates less than 200pm per minute render distortion-free images immediately
Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.