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Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be.

Ultimate Performance

  • Proprietary sensor design achieves closed-loop performance with noise levels for previously unseen on any AFM
  • Significantly reduced noise floor at less than 30pm enabling imaging at sub-nanometer resolution
  • Drift rates less than 200pm per minute render distortion-free images immediately

Enhanced Nanoscale Automation

Bruker’s new AutoMET™ software uniquely enables the combination of high-resolution AFM imaging with fast, automated metrology. It provides exceptional ease of use and adaptability for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment that makes it extremely easy to reduce complex measurement routines to simple, push-button operations.

Exceptional Productivity

  • Integrated alignment tools deliver quick and optimized probe positioning
  • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation
  • ScanAsyst® Imaging and NanoScope® software with default experiment modes distill decades of knowledge into preconfigured settings

Superior Versatility

  • Wide-open access to tip and sample accommodates a large variety of standard and customized experiments
  • Most sensitive and complete nanoscale mapping of permittivity and conductivity with PeakForce sMIM™
  • Instrument and software designed to take full advantage of all current and future Bruker AFM modes and techniques
  • Custom user-programmable scripts offer semi-automated measurement and analysis
The intuitive graphical user interface provides immediate access to eight channels and extensive controller functions. Image data (left) show topography of triblock copolymer with 5Kx5K data points, 10μm scan size in closed-loop. Zoomed image (right) is a