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Solving Challenges in Defect Inspection of Advanced Optics

Perform precise, fully automated imperfection and defect inspection of advanced optical components
Presented by Samuel Lesko, Ph.D., Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (September 23, 2019)


  • [00:03:11] Intro to surface inspection for fine optics for advanced applications
  • [00:06:28] Components and modes of non-contact interferometric profilers
  • [00:14:42] Quality control of high-end optics
  • [00:18:45] Beyond traditional visual inspection
  • [00:23:30] Options for 100% automation and full characterization, ranking, monitoring, and mapping of defects 
  • [00:41:18] For large and aspheric optics


  • [00:45:56] Can these non-contact methods be used to mesure surface profile as well?
  • [00:48:24] Can this method support pass/fail decisions against a scratch-and-dig specification of ISO 10110?
  • [00:50:42] What is the visible range for scanning? How long does it take?
  • [00:52:39] What are the limitats of this method?
  • [00:55:46] Can this method be used to qualify objects in high-volume manufacturing?