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▶ Watch On-Demand | 55 Minutes

Solving Challenges in Defect Inspection of Advanced Optics

Perform precise, fully automated imperfection and defect inspection of advanced optical components

이 동영상을 재생하려면 쿠키를 허용해야 합니다.

Presented by Samuel Lesko, Ph.D., Dir. of Technology and Apps Development, Bruker Nano Surfaces & Metrology (September 23, 2019)
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       PRESENTATION HIGHLIGHTS:

  • [00:03:11] Intro to surface inspection for fine optics for advanced applications
  • [00:06:28] Components and modes of non-contact interferometric profilers
  • [00:14:42] Quality control of high-end optics
  • [00:18:45] Beyond traditional visual inspection
  • [00:23:30] Options for 100% automation and full characterization, ranking, monitoring, and mapping of defects 
  • [00:41:18] For large and aspheric optics


       LIVE AUDIENCE Q&A:

  • [00:45:56] Can these non-contact methods be used to mesure surface profile as well?
  • [00:48:24] Can this method support pass/fail decisions against a scratch-and-dig specification of ISO 10110?
  • [00:50:42] What is the visible range for scanning? How long does it take?
  • [00:52:39] What are the limitats of this method?
  • [00:55:46] Can this method be used to qualify objects in high-volume manufacturing?

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