In this webinar, Application of Atomic Force Microscopy in the Study of Semiconductor Materials and Devices, our speakers highlight how Atomic Force Microscopy (AFM) can assist in nanometer scale characterization of semiconductor materials and devices.
The high-resolution imaging capability of AFM is augmented by the possibility to simultaneously measure electrical, mechanical and thermal properties, with the same nanometer scale resolution. Consequently, particular attention is given to electrical characterization, including carrier profiling inside devices, conductivity mapping on dielectrics, and failure analysis of devices.
In this webinar, we take a closer look at the capability to perform high-resolution imaging of surface topography. A few typical applications are covered:
Practical aspects such as tip selection, tip shape monitoring and tip lifetime, throughput, automation and extraction of critical analysis parameters are also discussed.
Finally, we focus on the capability to apply AFM for local chemical identification by combining it with nanoscale IR imaging and spectroscopy. Two interesting applications of this ‘AFM-IR’ approach are the chemical identification of contaminants and chemical mapping (with 10 nm spatial resolution) of specific materials.
Presentation Date: December 16, 2020
Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology
Ingo Schmitz, Ph.D.
Technical Marketing Engineer, Bruker