Integrated EDS Solutions for Desktop SEMs
Bruker provides a range of integrated energy‑dispersive X‑ray spectroscopy (EDS) systems designed for routine elemental analysis on benchtop and desktop scanning electron microscopes.
Engineered for daily laboratory use, these spectrometers support fast quantitative and qualitative elemental analysis, elemental mapping and line scanning on a desktop SEM.
Everything You Need to Perform EDS in One Package
Each EDS analysis system contains an XFlash® silicon drift detector, signal processing electronics and intuitive software, developed for turn-key operation:
- Peltier‑cooled XFlash® silicon drift detector provides best-in-class energy resolution with stable, vibration‑free operation without the need for liquid nitrogen.
- Compact electronics support high-resolution data acquistion and connect to host PC via standard Ethernet interface.
- ESPRIT Compact Software for EDS data processing, analysis and reporting.
Elemental Analysis and Mapping
Our EDS package enables qualitative and quantitative elemental analysis from boron through to the heavy elements.
Point analysis, line scans and spectral elemental mapping are all possible, allowing both localized compositional measurements and spatially resolved chemical characterization.
ESPRIT Compact Software
ESPRIT Compact software provides a unified environment for data collection, visualization, quantification, and reporting.
Core capabilities include automatic and manual peak identification, deconvolution, standardless quantification, live elemental mapping, and report generation.
Designed for Benchtop SEM Integration
Our EDS packages are engineered for compatibility with benchtop and tabletop scanning electron microscopes from a wide range of manufacturers.
Different system configurations are available to match specific SEM models and manufacturers for plug-and-play use.
To learn more contact one of our EDS experts.
