QUANTAX EDS for SEM

Once again Bruker sets standards in performance and functionality in energy-dispersive spectrometry for the scanning electron microscope. The new generation of QUANTAX EDS features the XFlash^® 6 detector series with active areas from 10 to 100 mm².

Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results:

Save time - New slim-line technology detectors, large area SDDs, multiple detector control and high performance pulse processing get the job done faster

Save effort - Motorized detector movement and light weight design make detector handling easier

Gain more precision - Best energy resolution provides the highest quality spectra for precise analysis 

Gain more reliability - The world's most comprehensive atomic database ensures most dependable low energy peak identification

Gain more accuracy - The most sophisticated algorithms for quantification and the unique combination of standardless and standard-based methods provide highest accuracy results

The combination of an individual microscope adaptation, unmatched speed and precision leads to the most powerful EDS system for any lab. This sytem includes spectral imaging, making micro and nano analysis no longer a challenge.

The XFlash^® detector family also offers optimized solutions for TEM and STEM as well as the unique XFlash^® FlatQUAD, a detector made to answer questions on tough samples.

Furthermore, the seamless integration of EDS together with EBSD, Micro-XRF and WDS in only one user interface ESPRIT provides the most comprehensive analysis platform for any SEM, FIB and EPMA.