The NanoWizard® 4 XP NanoScience atomic force microscope delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques. A wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties, makes it the most flexible system available on the market today.
The NanoWizard 4 XP NanoScience is equipped with a range of new features, including:
PeakForce Tapping provides superior force control and an uncomplicated setup, no matter what the sample or environment. No expert knowledge or cantilever tuning is necessary.
It enables precise control of probe-to-sample interactions and minimizes imaging forces, thereby protecting your tip and ensuring consistent, long-term, high-resolution imaging.
The fastest and easiest way to navigate is to see where you want to go. DirectOverlay 2 provides instant navigation, with direct selection of measurement positions anywhere within the scanner range. The Motorized Precision Stage and HybridStage™ free experiments of the lateral constraints of the AFM piezo range, and allow direct motorized movement to selected positions.
The new DirectTiling feature automatically creates a large optical overview to accelerate this process. Multiscan enables tiling of high-resolution images to build up a comprehensive overview of the sample. Repetitive or complicated measurement sequences can be automated using ExperimentPlanner™ macros.
The images show PDMS stamped surface pattern, sample courtesy of Dr. Claudio Canale, University of Genoa, Italy.  Optical image of reference pattern. Four square regions are marked with a concentric corner pattern, the inner corners form a 50 micron square with test patterns printed in the center, but not visible in the optics. Imported into the SPM software with DirectOverlay, such images allow single-click navigation between reference positions separated by many times the piezo range. QI Advanced images of two such reference patterns (see arrows), topography  +  and adhesion images + .
The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK's QI™-Advanced mode capabilities make this easy and straight forward. The NanoWizard 4 XP NanoScience system is supported by a comprehensive range of modes and accessories, each designed for easy handling and to meet the individual needs of researchers. Many experiments investigating material properties, including electrical properties, benefit from working in an enclosed cell to measure under a controlled inert gas atmosphere.
Bruker’s BioAFMs allow life science and biophysics researchers to further their investigations in the fields of cell mechanics and adhesion, mechanobiology, cell-cell and cell-surface interactions, cell dynamics, and cell morphology. We have collected a gallery of images demonstrating a few of these applications.
Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. Bruker provides you with the right accessories to control your sample conditions and to perform successful experiments.
The new V7 software interface guides users through the workflow to set up experiments intuitively and makes it simple, even for users with minimal AFM experience, to progress confidently to generating high-quality data. Each stage of the setup and operation works as an optimized desktop that brings all the vital information into focus with a single click.
Our webinars cover best practices, introduce new products, provide quick solutions to tricky questions, and offer ideas for new applications, modes, or techniques.