XFlash^® 7200 FIRE: Introducing 4-Channel X-ray Detection for EDS on SEM

The trailblazing largest-in-class XFlash^® 7200 FIRE changes what is possible in SEM EDS.

• Accelerate your qualitative and quantitative EDS analysis.
• Map samples at nanometer resolution with industry-leading count rates.
• Work at ultra-low dead times with parallel 4x signal processing
• Identify elemental lines across the entire EDS spectrum up to 30 keV.
• Detect light elements with best low-energy X-ray sensitivity.
• Perform STEM-in-SEM EDS up to 30kV. 
• Carry out ultra-fast, in-depth materials analysis with parallel EBSD mapping using our eWARP detector.

The exceptional performance of the XFlash^® 7200 FIRE is driven by its unique design.

The detector features four detector segments with a total active area of 200 mm², and 4x parallel signal processing to deliver energy resolution at industry-leading OCRs of up to 2,400,000 cps, overcoming the limitations of conventional detectors.

The XFlash^® 7200 FIRE's architecture and inclined geometry enable signal collection with the largest solid angles possible, maximizing collection efficiency and supporting parallel ultra-fast EBSD and micro-XRF on SEM for comprehensive material analysis.

The outstanding count-rate and efficiency performance of the detector support ultra-fast analysis at both high and low acceleration voltages with minimized sample drift for elemental mapping at ultra-high spatial resolutions.

With a windowless design XFlash^® 7200 FIRE has outstanding low-energy X-ray sensitivity for light element detection, and its optimized electron trap supports analysis across the full EDS spectrum up to 30 kV.

With its segmented 4-channel design, excellent energy resolution at high count rates, and the windowless design, the detector XFlash^® 7200 FIRE excels in demanding SEM EDS applications. In particular:

Semiconductor and Advanced Materials

The combination of high throughput, excellent spectral resolution, and full-spectrum elemental detection supports demanding analytical tasks such as nanometer resolution elemental mapping and distinguishing elements frequently used in semiconductors exhibiting demanding peak overlaps.

Battery Materials and Light-Element-Rich Samples

XFlash^® 7200 FIRE's windowless design maximizes low-energy X-ray detection for the analysis of battery materials, polymers and other samples with light elements.

Nanostructured Samples

The ability to acquire sufficient EDS data in short times even at low accelerating voltages enables the high-resolution characterization of samples with nanoscale features.

Life Science and Beam-Sensitive Samples

By maximizing X-ray collection efficiency and throughput, XFlash® 7200 FIRE enables the acquisition of statistically significant results at lower electron doses for the analysis of sensitive samples such as biological specimens.

In this live webinar, on October 27th, learn how QUANTAX EDS with XFlash® 7200 FIRE enables faster access to critical analytical insights, improves the determination of any sample composition, and enhances productivity across a wide range of applications. Discover how this next-generation technology empowers researchers and engineers to tackle increasingly complex materials challenges in semiconductor inspection, battery analysis, advanced manufacturing, life sciences, and beyond. 

XFlash^® 7200 FIRE is the flagship detector for our QUANTAX EDS for SEM analytical system. 

QUANTAX EDS for SEM includes everything you need to perform SEM EDS analysis, including an XFlash^® 7 detector, processing electronics and our comprehensive ESPRIT software suite.