XFlash® 7200 FIRE: Introducing 4-channel X-ray detection for EDS on SEM
The New Hero of Elemental Analysis on SEM
Meet the XFlash® 7200 FIRE - the next generation inclined energy dispersive X-ray spectroscopy (EDS) detector engineered for ultra-fast, high-resolution elemental analysis with Bruker’s QUANTAX EDS systems.
Thanks to its four silicon drift detector (SDD) segments, each with individual pulse processing, the XFlash® 7200 FIRE delivers an industry-leading output count rate (OCR) of up to 2,400,000 cps. It is therefore fully leveraging its largest-in-class active area to generate high-resolution elemental maps within seconds. The detector provides excellent energy resolution, enabling accurate elemental identification even under challenging analytical conditions. In addition, the windowless design and the full coverage of SEM high voltages from 0 to 30 kV facilitate exceptional sensitivity for light elements and demanding peak separation.
XFlash® 7200 FIRE: Ignite Your EDS Analysis
XFlash® 7200 FIRE is a Four-segment Integrated detector for Rapid EDS.
This trailblazing largest-in-class SD detector with a 2,400,000 cps OCR redefines what is possible in SEM EDS.
- Speed up your qualitative and quantitative EDS analysis workflow
- Map samples at nanometer resolution with industry-leading count rates
- Work with ultra-low dead times thanks to the highly efficient parralel 4x signal processing
- Access and distinguish elemental lines across the entire EDS spectrum from 0 - 30 keV
- Detect light elements with highest low-energy X-ray collection efficiency
- Perform STEM-in-SEM EDS up to 30kV
- Carry out ultra-fast comprehensive analyses with parallel EBSD mapping using our eWARP detector
The Future of EDS Starts Here: Introducing 4-Channel X-ray Detection
The XFlash® 7200 FIRE delivers elemental analysis at excellent speed as well as resolution, thanks to the separation of the SDD into 4 segments.
The XFlash® 7200 FIRE is the first large area inclined detector of its kind, with a 4-channel SDD design for quantitative and qualitative elemental analysis at industry-leading energy resolutions and count rates.
The detector’s segmented design with a total active area of 200 mm2 overcomes the throughput and energy resolution limitations associated with large-area single SDD detectors.
The XFlash® 7200 FIRE achieves the highest possible solid angles on any SEM maximizing X-ray collection efficiency and optimally supports parallel ultra-fast EBSD and micro-XRF on SEM analysis.
X-ray detection across 4 independent SDD segments combined with the 4 x parallel signal processing delivers exceptional throughput and energy resolution at count rates far exceeding conventional large-area SDDs. The result is highly accurate qualitative and quantitative elemental analysis at unprecedentedly short measurement times and ultra-low dead times.
Exceptional X-ray collection efficiency facilitates the fastest analysis at low and high acceleration voltages, ensuring minimal sample drift for best spatial resolution.
With its windowless detector design the XFlash® 7200 FIRE provides outstanding sensitivity for low-energy X-rays, enabling the detection of light elements.
The optimized electron trap supports operation at SEM high voltages up to 30 kV, providing true full-spectrum EDS performance from the lightest detectable elements through to the highest-energy characteristic X-rays.
Push the Limits of What is Possible in EDS with XFlash® 7200 FIRE
With its segmented 4-channel design, excellent energy resolution at high count rates, and the windowless design, the detector XFlash® 7200 FIRE excels in demanding SEM EDS applications. In particular:
Semiconductor and Advanced Materials
The combination of high throughput, excellent spectral resolution, and full-spectrum elemental detection supports demanding analytical tasks such as nanometer resolution elemental mapping and distinguishing elements frequently used in semiconductors exhibiting demanding peak overlaps.
Battery Materials and Light-Element-Rich Samples
XFlash® 7200 FIRE's windowless design maximizes low-energy X-ray detection for the analysis of battery materials, polymers and other samples with light elements.
Nanostructured Samples
The ability to acquire sufficient EDS data in short times even at low accelerating voltages enables the high-resolution characterization of samples with nanoscale features.
Life Science and Beam-Sensitive Samples
By maximizing X-ray collection efficiency and throughput, XFlash® 7200 FIRE enables the acquisition of statistically significant results at lower electron doses for the analysis of sensitive samples such as biological specimens.
Register Now: The Future of EDS Starts Here - Introducing 4-Channel X-ray Detection
In this live webinar, on October 27th, learn how QUANTX EDS with XFlash® 7200 FIRE enables faster access to critical analytical insights, improves the determination of any sample composition, and enhances productivity across a wide range of applications. Discover how this next-generation technology empowers researchers and engineers to tackle increasingly complex materials challenges in semiconductor inspection, battery analysis, advanced manufacturing, life sciences, and beyond.
Discover QUANTAX EDS for SEM
XFlash® 7200 FIRE is the flagship detector for our QUANTAX EDS for SEM analytical system.
QUANTAX EDS for SEM includes everything you need to perform SEM EDS analysis, including an XFlash® 7 detector, processing electronics and our comprehensive ESPRIT software suite.