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Рентгеновская дифракция (XRD) and Scattering

Non-destructive Characterization of Material Properties

Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative and quantitative techniques include:

  • Phase Identification
  • Quantitative Analysis
  • Crystal structure determination
  • PDF analysis (total scattering)
  • Small Angle X-Ray Scattering (SAXS)
  • X-Ray Reflectometry (XRR)
  • High Resolution X-Ray Diffraction (HRXRD)
  • Reciprocal Space Mapping (RSM)
  • Residual Stress
  • Texture (pole figures)


For more information please see our PDF file on X-ray Diffraction or contact us.