On-Demand Session: Hyperspectral Characterization of Advanced Materials using AFM
Introduction and overview to the Hyperspectral DataCube Concept
PRESENTATION HIGHLIGHTS:
[00:00:19] Principle of hyperspectral datacube
[00:05:28] AFM modes for nanomechanical characterization
[00:10:00] DataCube principle
[00:12:42] DataCube-TUNA
[00:14:32] DataCube-SCM
[00:15:57] DataCube-sMIM
[00:17:57] DataCube-SThM
[00:19:08] Conclusion
DataCube Contact Resonance PFM for Accurate Measurements of Piezo Electric Properties
PRESENTATION HIGHLIGHTS:
[00:00:38] Principle of piezoelectric force microscopy (PFM)
[00:04:41] How to enhance the PFM signal
[00:08:45] Challenge in conventional CR-PFM measurements
[00:11:28] DataCube contact resonance PFM
[00:16:50] Real-time measurements
Correlative Chemical and Mechanical Information by Resonance Enhance Force Volume Mode (REFV)
PRESENTATION HIGHLIGHTS:
[00:00:22] Introduction to AFM-IR
[00:03:08] AFM-IR modes of operation
[00:03:54] REFV AFM-IR principle and examples
[00:15:24] Summary
Q&A
PRESENTATION HIGHLIGHTS:
[00:00:09] Is there dedicated probes required for this DataCube mode?
[00:01:30] Is there a feedback during the whole section for bending to keep the force constant?
[00:03:00] Can you combine PFM with conductivity measurement and then do DataCube with a DC bias to have both information at the same time?
[00:04:10] Are there any artifact caused by transitory regime of the lock-ins, and how fast is the response time?
[00:07:14] Is this DataCube available on every Bruker AFMs?
