Nanoscale Surface Characterization of Polymeric Materials and Products
Explore Tools and Techniques for Nanoscale Polymer Property Measurement
Featuring a panel of Bruker application experts, the recording includes presentations and live technical demonstrations highlighting the features, capabilities, and practical use of Bruker's tools and techniques for nanoscale polymer property measurement.
Presentations topics includes:
- High-resolution AFM-based measurement of nano-scale mechanical, electrical, and temperature-dependent properties
- High-performance chemical characterizatiion via photothermal AFM-IR
- Nanomechanical characterization of viscoelastic properties by nanoindentation
Featured Presentations and Technical Demonstrations
Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometer-scale surface characterization of polymeric materials and products.
Attendees of this virtual Surface Lab session can expect to explore a range of these characterization techniques as they are used by leading researchers in the field of polymer research.
With welcome address, introduction, live audience Q&A, and closing remarks by Dr. Peter De Wolf, Worldwide Application Director, Bruker
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For more information about this event or the products and techniques featured in it, please contact us or submit the form below.
Dr. Heiko Haschke, Head of BioAFM Applications, Bruker
Dr. Mickael Febvre, Application Manager, Bruker
Dr. Thomas Henze, BioAFM Application Scientist, Bruker
When studying polymeric materials, AFM has many benefits over alternative techniques.
- The sharp apex and precise force control provided by AFM enables researchers to probe heterogeneous sample surfaces with a resolution down to the nanometer level.
- AFM enables the characterization of various material properties including but not limited to elastic and viscoelastic properties as well as electrical and thermal properties
- AFM can be performed over a wide range of temperatures in both air and liquid, enabling the in-situ investigation of varying environmental conditions on sample properties. In additional, the fast scanning capabilities of AFM enable the detailed investigation of dynamic processes like crystallization and melting of polymers.
Several different AFM methods for measuring the properties of polymers will be covered, from high resolution elastic & viscoelastic mechanical property mapping to nano-electrical and temperature dependent measurements.
Dr. Miriam Unger, NanoIR Application Scientist, Bruker
Dr. Hartmut Stadler, Application Scientist, Bruker
Combining IR spectroscopy with the high-resolution imaging capabilities of AFM enables the chemical characterization of polymeric materials. We will provide insights into new and existing photothermal AFM-IR techniques and demonstrate how to achieve high performance results.
Dr. Ude Hangen, Nanoindentation Application Manager, Bruker
Dr. Jaroslav Lukes, Application Scientist, Bruker
Nano-mechanical characterization can also be achieved using nano-indentation methods.
We will
- Introduce the technique
- Present case studies examining viscoelastic properties using the nanoDMA method
- Outline the influence of environmental conditions
Speakers
Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology
Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA
Miriam Unger, Ph.D.
Applications Manager EMEA, NanoIR, Bruker Nano GmbH
Hartmut Stadler, Ph.D., Application Scientist, Bruker
Heiko Haschke, Ph.D., Application Scientist, Bruker
Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker
Ude Hangen, Ph.D.
Applications Manager, Bruker EMEA
Jaroslav Lukes, Ph.D., Applications Scientist, Bruker
