Virtual Event, Actual Science

Nanoscale Surface Characterization of Polymeric Materials and Products

High-performance metrology techniques for the characterization of polymers

Explore Tools and Techniques for Nanoscale Polymer Property Measurement

Attendees of this virtual Surface Lab session can expect to explore a range of characterization techniques as they are used by leading researchers in the field of polymer research.

With welcome address, introduction, live audience Q&A, and closing remarks by Dr. Peter De Wolf, Worldwide Application Director, Bruker

Watch On Demand Webinar Summary

Introduction

Presented by Peter De Wolf, Ph.D., WW Application Director, Bruker Nano Surfaces & Metrology (October 6, 2021)

Highlights

[00:01:39] Event agenda – overview of presentation topics and speakers
[00:03:18] Introduction to the topic of nanoscale polymeric chanracterization
[00:03:50] Overview of structural properties accessible via BioAFM, nanoIR, and/or nanoindentation methods
[00:07:18] Overview of select nanomechanical, nanoelectrical, and nanothermal properties

Webinar Summary

Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometer-scale surface characterization of polymeric materials and products. Featuring a panel of Bruker application experts, this webinar includes presentations and live technical demonstrations highlighting the features, capabilities, and practical use of Bruker's tools and techniques for nanoscale polymer property measurement. During this webinar, you can expect to:

Gain understanding about the applications, advantages, and considerations of different property characterization methods
View event-exclusive demonstrations of various tools and techniques for characterizing the nanoscale properties of polymeric samples
Hear Bruker experts answer audience questions submitted by polymer researchers

Presentations topics include:

High-resolution AFM-based measurement of nano-scale mechanical, electrical, and temperature-dependent properties
High-performance chemical characterization via photothermal AFM-IR spectroscopy
Nanomechanical characterization of viscoelastic properties by nanoindentation

Find out more about solutions for the characterization of polymeric materials that Bruker offers:

Webinar Overview

Presentation Lenght	Presentation Title	Presenter	Abstract
55 min	Nanoscale Topography and Advanced Physical Property Characterization Using AFM	Mickael Febvre Thomas Henze Heiko Haschke	When studying polymeric materials, AFM has many resolution and versatility benefits over alternative techniques. The sharp apex and precise force control provided by AFM enables researchers to probe heterogeneous sample surfaces with a resolution down to the nanometer level AFM enables the characterization of various material properties including but not limited to elastic and viscoelastic properties as well as electrical and thermal properties AFM can be performed over a wide range of temperatures in both air and liquid, enabling the in-situ investigation of varying environmental conditions on sample properties. In addition, the fast-scanning capabilities of AFM enable the detailed investigation of dynamic processes like crystallization and melting of polymers The presenters cover several different AFM methods for measuring the properties of polymers, from high-resolution elastic & viscoelastic mechanical property mapping to nano-electrical and temperature-dependent measurements.
25 min	Nanoscale Spectroscopy and Imaging Using NanoIR – Photothermal AFM-IR Talk and live demo	Miriam Unger Hartmut Stadler	Combining IR spectroscopy with the high-resolution imaging capabilities of AFM enables the chemical characterization of polymeric materials. The presenters provide insights into new and existing photothermal AFM-IR techniques and demonstrate how to achieve high-performance results.
27 min	Investigating the Influence of Environmental Conditions with Nano-Indentation	Ude Hangen Jaroslav Lukes	Nano-mechanical characterization can also be achieved using nano-indentation methods. The presenters in this segment: Introduce the technique Present case studies examining viscoelastic properties using the nanoDMA method Outline the influence of environmental conditions

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Speakers

Peter De Wolf, Ph.D.,

Director of Technology & Application Development

Peter De Wolf is director for AFM technology & application development at Bruker Nano Surfaces, covering all applications related to Scanning Probe Microscopy (SPM). He obtained his PhD from IMEC, Belgium on the development of new SPM methods for 2D carrier profiling in semiconductors and has more than 25 years of experience on SPM. He is the author and co-author of over 30 publications related to electrical characterization using SPM. He also owns several SPM patents, and developed several new SPM modes for electrical characterization.

Heiko Haschke, Ph.D., Application Scientist, Bruker

Heiko Haschke received his Ph.D. in physics from the University of Bristol, UK, where he focused on the application and development of high-speed imaging and force spectroscopy for studying single biomolecular interactions. In 2001, he joined JPK Instrument AG as a developer of nanoanalytical instrumentation, in particular, AFMs and optical tweezers for biological applications. In 2004, he set up and became head of the Applications group, a team of applications scientist experts, providing worldwide customer and technical support. Since 2020, he is overseeing the worldwide applications development of the NanoRacer® high-speed AFM, from the BioAFM unit of Bruker Nano, based in Berlin, Germany.

Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA

Miriam Unger, Ph.D.
Applications Manager EMEA, NanoIR, Bruker Nano GmbH

Hartmut Stadler, Ph.D., Application Scientist, Bruker

Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker

Ude Hangen, Ph.D.
Applications Manager, Bruker EMEA

Jaroslav Lukeš, Ph.D., Sales Applications Scientist, Bruker

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