Bruker's Anasys nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples. The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications. The nanoIR3-s with broadband option adds the latest OPO/DFG femtosecond laser technology to provide the broadest available spectral range (670 to 4000 cm⁻¹) with high-resolution nanochemical and nano-optical imaging capabilities.
POINTspectra lasers enable both spectroscopy and high-resolution optical property mapping across a broad range of wavelengths. With nanoIR3-s it is a simple task to generate correlated data:
Equipped with optional OPO/DFG femtosecond laser technology, the nanoIR3-s system delivers the broadest spectral range to enable high-performance combined spectroscopy and high-resolution nanochemical imaging. This unique set of capabilities enables research in a broad range of research areas in historically inaccessible spectral regions.
High-quality, high-resolution nano-optical images can be generated for characterization of a wide range of optical phenomena, such as graphene plamonics and surface phonon polaritons in hexagonal boron nitride (hBN), and chemical imaging of biological and other organic samples.