Bruker's Anasys nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples. The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications.
Only nanoIR3-s provides:
POINTspectra lasers enable both spectroscopy and high-resolution optical property mapping across a broad range of wavelengths. With nanoIR3-s it is a simple task to generate correlated data:
Bruker partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.
Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.