纳米级红外光谱仪

Anasys nanoIR3-s 纳米扫描近场光学成像系统

高性能的 s-SNOM 和 AFM 成像

Anasys nanoIR3-s

布鲁克Anasys的 nanoIR3-s 系统将散射扫描近场光学显微镜(s-SNOM)、纳米级红外光谱(AFM-IR)与原子力显微镜(AFM)完美整合到单一平台。依托 Anasys 技术在 AFM 纳米光学表征方面的领先地位,nanoIR3-s 可提供纳米级红外光谱、化学成像和光学成像,在 2D 材料样品上实现 10 纳米空间分辨率。该系统还可以提供达到纳米级分辨率的 AFM 形貌和性能成像,因此是对各种材料科学应用开展相关性研究的理想仪器。

To learn more, continue reading, contact us, or see FAQs about this product.

宽带
纳米 FTIR 光谱
可用于开展以前无法实现的飞秒纳米级红外研究。
互补性
s-SNOM 和 AFM-IR 技术
单一平台实现纳米级化学成像和光学成像。
高分辨率
原子力显微镜
提供相关的电学、机械性能和热物性数据。

10nm 空间分辨率化学成像和光谱

石墨烯等离子体

石墨烯等离子体:石墨烯楔上表面等离极化激元(SPP)的 s-SNOM 相位和振幅图像。(左图)s-SNOM 相位与 SPP 驻波线型截面;(右图) s-SNOM 振幅。上图是相位图的 3D 视图(左图)。

高分辨性能成像

高分辨性能成像:通过石墨烯片的横截面显示了 10nm 以下分辨率的光学属性成像。

高性能纳米级 FTIR 光谱

超快宽带s-SNOM光谱,探测分子振动信息。聚四氟乙烯(PTFE)激光干涉图显示,时域(上图)内发生自由感应衰减形式的相干分子振动。样品干涉图中突出显示特征的形成原因是,C-F 模式的对称模式和反对称模式在所产生的频域跳动(左下图)。单层 pNTP(右下图)上展示了纳米级 FTIR 的单层灵敏度。数据提供:Markus Raschke 教授,美国科罗拉多大学博尔德分校。

只有 nanoIR3-s 能够提供:

  • 高性能纳米级 FTIR 光谱
  • 高性能红外近场光谱,采用目前最先进的纳米红外激光源
  • 纳米级 FTIR 光谱,采用集成式DFG,可与宽带同步辐射光源集成
  • 适用于光谱和化学成像的多芯片 QCL 激光源

点光谱技术

POINTspectra 激光器可执行多个波长的光谱分析和高分辨光学成像。nanoIR3-s让测试更加简单:

  1. 在 AFM 图像中选择要测量的特征
  2. 测量样品的波谱,选择感兴趣的波长
  3. 采集高分辨光学属性图
根据对多个波长的干涉图的快速测量,获得空间分辨率达到 10nm 的振幅和相位图像     实现 10nm 分辨率Tapping AFM-IR,用于独特的互补性红外光谱分析。

Broadband Laser Option

Nanoscale FTIR spectroscopy with the broadest available spectral range (670 to 4000 cm⁻¹)

Equipped with optional OPO/DFG femtosecond laser technology, the nanoIR3-s system delivers the broadest spectral range to enable high-performance combined spectroscopy and high-resolution nanochemical imaging. This unique set of capabilities enables research in a broad range of research areas in historically inaccessible spectral regions.


Complementary high-resolution imaging

High-quality, high-resolution nano-optical images can be generated for characterization of a wide range of optical phenomena, such as graphene plamonics and surface phonon polaritons in hexagonal boron nitride (hBN), and chemical imaging of biological and other organic samples.

Anasys NanoIR3-s FAQs

Frequently Asked Questions

Does nanoIR3-s support s-SNOM as well as AFM-IR?

Yes, nanoIR3-s combines AFM-IR with s-SNOM capabilities for advanced studies of plasmonic, photonic, and electronic materials. Offering multimodal nanospectral analysis.

Which photothermal AFM-IR modes are available on the nanoIR3-s system?

nanoIR3-s offers Tapping AFM-IR and Resonance Enhanced AFM-IR as standard, and can be equipped with Surface Sensitive AFM-IR if the appropriate lasers and probes are included in the configuration.

Is external-source coupling supported on nanoIR3-s?

External-source coupling is possible but should be discussed with Bruker to ensure compatibility.

More About Bruker's Nanoscale Infrared Technology

Can the spectra from Bruker’s photothermal AFM-IR systems be interpreted in the same way as FTIR spectra?

Yes. Bruker’s photothermal AFM-IR technology produces spectra that are directly comparable to FTIR spectra, as demonstrated in published documentation and peer-reviewed articles. AFM-IR spectra can be searched directly against FTIR spectral databases. If FTIR-like spectral analysis is critical for your application, our experts can provide evidence showing spectral correlation.

How does photothermal AFM-IR compare with Raman-AFM or s-SNOM?

Photothermal AFM-IR provides direct absorption-based spectra that closely match FTIR results and are easier to interpret than Raman-AFM or s-SNOM. Further, Photothermal AFM-IR signals are amplified by the resonant enhancement of the cantilever providing the best signal-to-noise of those techniques. Bruker offers s-SNOM as a separate option for advanced near-field studies.

What spatial resolution and sensitivity can I expect from Bruker’s photothermal AFM-IR systems?

Bruker nanoIR systems routinely achieve chemical imaging with spatial resolution below 10 nm and can detect single molecular layers. Actual performance depends on your sample and selected measurement mode.

Can photothermal AFM-IR systems identify nanoplastics or other sub-micron particles?

Yes, photothermal AFM-IR can chemically map and identify particles smaller than one micron, including nanoplastics and environmental contaminants. Direct correlation to FTIR provides ready interpretation in particles as small as 10 nm. 

What utilities and site requirements should I consider when planning for installation of a photothermal AFM-IR system?

Bruker’s photothermal AFM-IR systems typically require a single socket of standard electrical power,and CDA. Specific requirements may vary by model, so request a site preparation guide from your Bruker representative.

What laser options and spectral coverage are available on Bruker’s photothermal AFM-IR systems?

Bruker photothermal AFM-IR systems primarily use quantum cascade lasers (QCLs) that deliver stable, reliable performance and broad coverage across the mid-infrared fingerprint region as well as optical parametric oscillators (OPOs) for the C-H, O-H, N-H stretching region. Multiple QCL chips can be combined to access all key spectral windows required for routine and advanced research, and additional sources are available for specialized applications. Bruker’s application experts can help you select the optimal laser configuration to match your measurement needs and ensure sufficient spectral resolution for both standard and demanding experiments.

How long do typical measurements take for spectra, chemical mapping, and automated recipes?

Measurement times vary by application, but point spectra can be acquired in seconds, chemical maps in minutes, and automated recipes can be tailored for high-throughput workflows.

What is the recommended maintenance schedule for Bruker nanoIR systems?

Routine maintenance includes probe replacement, laser alignment checks, and calibration with reference samples. Bruker provides detailed maintenance protocols and support plans.

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