Anasys nanoIR3-s

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Anasys nanoIR3-s

Bruker's Anasys nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples. The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications.

Broadband

nano-FTIR spectroscopy

Delivers previously unobtainable femtosecond nanoscale infrared research.

Complementary

s-SNOM and AFM-IR techniques

Enables nanoscale chemical and optical property mapping on a single platform.

High-resolution

atomic force microscopy

Provides correlated electrical, mechanical, and thermal data.

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Características

10nm Spatial Resolution Chemical Imaging and Spectroscopy

Graphene Plasmonics

Graphene Plasmonics: s-SNOM phase and amplitude images of surface plasmon polariton (SPP) on a graphene wedge. (left) s-SNOM phase with a line cross-section of the SPP standing wave; (right) s-SNOM amplitude. Top image is a 3D view of Phase image (left).

High-Resolution Property Mapping

High-Resolution Property Mapping: Cross-section through the graphene flake shows sub 10nm resolution optical property imaging.

Highest Performance Nano FTIR Spectroscopy

Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US.

Only nanoIR3-s provides:

Highest performance nano FTIR spectroscopy
Highest performance IR SNOM spectroscopy with the most advanced nanoIR laser source available
nano FTIR spectroscopy with integrated DFG, continuum based laser source Broadband synchrotron light source integration
Multi-chip QCL laser source for spectroscopy and chemical imaging

POINTspectra Technology

POINTspectra lasers enable both spectroscopy and high-resolution optical property mapping across a broad range of wavelengths. With nanoIR3-s it is a simple task to generate correlated data:

Select feature to be measured in the AFM image
Measure spectroscopy of sample and select wavelength of interest
Create high-resolution optical property map

10nm spatial resolution images of amplitude and phase are rapidly measured from interferograms over a range of wavelengths Enables 10nm resolution Tapping AFM-IR for complementary, unique IR spectroscopy.

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