Bruker's Anasys nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples. The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications.
Only nanoIR3-s provides:
POINTspectra lasers enable both spectroscopy and high-resolution optical property mapping across a broad range of wavelengths. With nanoIR3-s it is a simple task to generate correlated data: