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Nanoscale Surface Characterization of Polymeric Materials and Products

High-performance metrology techniques for the characterization of polymers

Part 1: Nanoscale Topography and Advanced Physical Property Characterization Using AFM
Part 2: Nanoscale Spectroscopy and Imaging Using NanoIR - Photothermal AFM-IR
Part 3: Investigating the Influence of Environmental Conditions with Nano-Indentation

Find out more information about Bruker's solutions for nanoscale characterization of polymers:

▶ Watch On-Demand | 55 Minutes

Nanoscale Topography and Advanced Physical Property Characterization Using AFM

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Presented by Mickael Febvre, Ph.D. EMEA Applications Director, Bruker; Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker; and Heiko Haschke, Ph.D., Application Scientist, Bruker (October 6, 2021)

▶ Watch On-Demand | 26 Minutes

Nanoscale Spectroscopy and Imaging using NanoIR Photothermal AFM-IR

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Presented by Miriam Unger, Ph.D., NanoIR Application Scientist, Bruker and Hartmut Stadler, Ph.D., Application Scientist, Bruker (October 6, 2021)

▶ Watch On-Demand | 28 Minutes

Investigating the Influence of Environmental Conditions with Nano-Indentation

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Presented by Ude Hangen, Ph.D., Applications Manager, Bruker and Jaroslav Lukes, Ph.D., Applications Scientist, Bruker (October 6, 2021)

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RETURN TO SESSION OVERVIEW

Nanoscale Surface Characterization of Polymeric Materials and Products

Nanoscale Topography and Advanced Physical Property Characterization Using AFM

Nanoscale Spectroscopy and Imaging using NanoIR Photothermal AFM-IR

Investigating the Influence of Environmental Conditions with Nano-Indentation

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