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Nanoscale Surface Characterization of Polymeric Materials and Products

High-performance metrology techniques for the characterization of polymers

Find out more information about Bruker's solutions for nanoscale characterization of polymers:

▶ Watch On-Demand | 55 Minutes

Nanoscale Topography and Advanced Physical Property Characterization Using AFM

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Presented by Mickael Febvre, Ph.D. EMEA Applications Director, Bruker; Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker; and Heiko Haschke, Ph.D., Application Scientist, Bruker (October 6, 2021)
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Nanoscale Spectroscopy and Imaging using NanoIR Photothermal AFM-IR

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Presented by Miriam Unger, Ph.D., NanoIR Application Scientist, Bruker and Hartmut Stadler, Ph.D., Application Scientist, Bruker (October 6, 2021)
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Investigating the Influence of Environmental Conditions with Nano-Indentation

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Presented by Ude Hangen, Ph.D., Applications Manager, Bruker and Jaroslav Lukes, Ph.D., Applications Scientist, Bruker (October 6, 2021)

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