Attendees of this virtual Surface Lab session can expect to explore a range of characterization techniques as they are used by leading researchers in the field of polymer research.
With welcome address, introduction, live audience Q&A, and closing remarks by Dr. Peter De Wolf, Worldwide Application Director, Bruker
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Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometer-scale surface characterization of polymeric materials and products. Featuring a panel of Bruker application experts, this webinar includes presentations and live technical demonstrations highlighting the features, capabilities, and practical use of Bruker's tools and techniques for nanoscale polymer property measurement. During this webinar, you can expect to:
Presentations topics include:
Find out more about solutions for the characterization of polymeric materials that Bruker offers:
|Presentation Lenght||Presentation Title||Presenter||Abstract|
|55 min||Nanoscale Topography and Advanced Physical Property Characterization Using AFM||
When studying polymeric materials, AFM has many resolution and versatility benefits over alternative techniques.
The presenters cover several different AFM methods for measuring the properties of polymers, from high-resolution elastic & viscoelastic mechanical property mapping to nano-electrical and temperature-dependent measurements.
|25 min||Nanoscale Spectroscopy and Imaging Using NanoIR – Photothermal AFM-IR Talk and live demo||Combining IR spectroscopy with the high-resolution imaging capabilities of AFM enables the chemical characterization of polymeric materials. The presenters provide insights into new and existing photothermal AFM-IR techniques and demonstrate how to achieve high-performance results.|
|27 min||Investigating the Influence of Environmental Conditions with Nano-Indentation||
Nano-mechanical characterization can also be achieved using nano-indentation methods.
The presenters in this segment:
Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology
Heiko Haschke, Ph.D., Application Scientist, Bruker
Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA
Miriam Unger, Ph.D.
Applications Manager EMEA, NanoIR, Bruker Nano GmbH
Hartmut Stadler, Ph.D., Application Scientist, Bruker
Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker
Ude Hangen, Ph.D.
Applications Manager, Bruker EMEA
Jaroslav Lukes, Ph.D., Applications Scientist, Bruker