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Expansion of 3D Optical Profiler to Wide Field and Rough Samples

Bruker invites you to join our complimentary webinar focusing on expanding the 3D optical profiler toward large field of view and rough surfaces through Focus Variation technique.

Bruker invites you to join our complimentary webinar focusing on expanding the 3D optical profiler toward large field of view and rough surfaces through the Focus Variation technique. This measurement mode improves the user experience in daily operation and allows direct high-quality visualization of rough surfaces.

Key Topics

  • Principle of focus variation
  • Metrology capabilities & boundaries conditions for best data collection
  • Using color image information for masking, levelling surface and correlating with topography

Who Should Watch

  • 3D optical profiler users
  • Metrology lab managers
  • Quality engineers

Speaker

Samuel Lesko

Bruker (USA)

Senior Application Development Manager

Samuel has Ph.D. and engineering degree in material science from the University of Burgundy in France. Since 2000, he built extensive experience in optical profiler, particularly in using white light interferometry applied to MEMS, semiconductor, automotive and aerospace. His vast experience and passion in correlating roughness parameters with the performance of devices or parts has aided countless researchers and engineers in both academic and industrial settings