This webinar explores how Focus Variation — a non-contact 3D measurement method for fast, accurate areal surface topography measurement — improves operator experience and allows direct, high-quality visualization of wide-field and rough samples.
This presentation explores key considerations, necessary capabilities, and technical solutions for navigating the challenges faced by metrology lab managers, quality engineers, and researchers currently using 3D optical profilers in their work. Topics include:
Use case study applications include:
This webinar was presented on November 11, 2018.
Find out more about the technology featured in this webinar or our other solutions for measuring surface topography at the nano-scale:
Samuel Lesko, Ph.D.
Dir. of Technology and Apps Development for Tribology, Stylus & Optical Profilers, Bruker
Samuel Lesko has over 20 years of optical and stylus profiler applications experience, particularly in using white-light interferometry in a wide variety of fields, from MEMS and semiconductor to automotive and aerospace. He is a member of SME and part of ISO/TC 213/WG committee (areal roughness) and obtained his physics Ph.D. and material science engineering degree at the University of Burgundy in France.