Stylus and Optical Profilometry Webinars

Expansion of 3D Optical Profiler to Wide Field and Rough Samples

Learn when and why to use Focus Variation for 3D surface topography measurement and how it extends the capabilities of 3D optical profilers

Focus Variation extends 3D optical profiler capabilities to include measuring rough surfaces and capturing data over a larger field of view.

This webinar explores how Focus Variation  — a non-contact 3D measurement method for fast, accurate areal surface topography measurement — improves operator experience and allows direct high-quality visualization of wide-field and rough samples.

Find out more about the technology featured in this webinar or our other solutions for surface roughness measurement:

Recorded on November 11, 2018

Optimize Product Design, Manufacturing Processes, and Operator Experience

This presentation explores key considerations, necessary capabilities, and technical solutions for navigating the challenges faced by metrology lab managers, quality engineers, and researchers currently using 3D oprical profilers in their work. Topics include

  • Principle of focus variation;
  • Metrology capabilities & boundaries conditions for best data collection; and
  • Using color image information for masking, levelling surface and correlating with topography.

Use case study applications include:

  • Tribology (examples: servicing labs, tribology departments, and failure analysis labs);
  • Corrosion testing (examples: servicing labs, pipe manufacturing R&D, coatings research);
  • Aesthetic and Perception Assessment (samples: automotive interior, fabrics, paper); and
  • Additive Manufacturing and 3D Printing (examples: fine-tuning the manufacturing process, printer and powder/material qualification, quality control).


Samuel Lesko, Ph.D.
Dir. of Technology and Apps Development for Tribology, Stylus & Optical Profilers, Bruker


Samuel Lesko has over 20 years of optical and stylus profiler applications experience, particularly in using white-light interferometry in a wide variety of fields, from MEMS and semiconductor to automotive and aerospace. He is a member of SME and part of ISO/TC 213/WG committee (areal roughness) and obtained his physics Ph.D. and material science engineering degree at the University of Burgundy in France.