How to Extend Your Wyko and Bruker Optical Profiler Capabilities

Learn how to collect comprehensive 3D surface visualization and analytical data by combining WLI optical profiler technology with Vision64 map software

New capabilities both improve routine operation and create new, advanced possibilities for visualization by 3D optical profilometry.

This webinar focuses on the features and capabilities of our 3D optical profiler technology, particularly in combination with advanced Vision64 acquisition and analysis software, and how they impact 3D optical profilometry research.

Webinar Summary

Key topics include:

  • How to collect comprehensive 3D surface topography and analytical data
  • Achieving sub-nanometer vertical resolution on large stepped surfaces (e.g. MEMS, Microfluidics)
  • Breaking the diffraction limit on patterned surfaces and gratings
  • Protocols to measure highly sloped samples > 75 degrees
  • Quantify the thickness of thin transparent film down to 100nm
  • Generating reports through VisionMap64 software
  • Advanced data processing with latest S parameters (ISO25178 compliance)


This webinar was presented on March 20, 2018.

Find out more about the technology featured in this webinar or our other solutions for 3D surface measurement:


Samuel Lesko, Ph.D.
Dir. of Technology and Apps Development for Tribology, Stylus & Optical Profilers, Bruker


Samuel Lesko has over 20 years of optical and stylus profiler applications experience, particularly in using white-light interferometry in a wide variety of fields, from MEMS and semiconductor to automotive and aerospace. He is a member of SME and part of ISO/TC 213/WG committee (areal roughness) and obtained his physics Ph.D. and material science engineering degree at the University of Burgundy in France.