How to Extend Your Wyko and Bruker Optical Profiler Capabilities
This webinar focuses on new features in Vision64 acquisition and analysis software, improving both routine operation and adding new advanced capabilities.
Key topics include:
- Achieving sub-nanometer vertical resolution on large stepped surfaces (e.g. MEMS, Microfluidics)
- Breaking the diffraction limit on patterned surfaces and gratings
- Protocols to measure highly sloped samples > 75 degrees
- Quantify the thickness of thin transparent film down to 100nm
- Generating reports through VisionMap64 software
- Advanced data processing with latest S parameters (ISO25178 compliance)
