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Nanoscale IR Spectroscopy (AFM-IR): Achieving Molecular Understanding of Polymer Systems

The webinar overviews how Dow Chemical is using the nanoIR2 to provide a deeper understanding at the molecular level of polymer systems to observe chemical contrasts in polymeric materials.

"We find the AFM-IR to be a very Powerful Technology for Characterizing Structures at the Nanoscale."

The webinar overviews how Dow Chemical is using the nanoIR2 to provide a deeper understanding at the molecular level of polymer systems to observe chemical contrasts in polymeric materials.

Webinar Topics

  • AFM-IR technology and recent innovations
  • Special focus on AFM-IR application in polymer systems
  • Hybrid multi-layer polymer films
  • Review of AFM-IR spatial resolution

Speaker

Dr. Greg Meyers

Fellow, Core R&D - Analytical Science, The Dow Chemical Company, Midland, MI

Gregory F. Meyers, PhD, is a Fellow in Core R&D – Analytical Sciences at The Dow Chemical Company.  He has technical leadership for strategic planning within the Surface & Interface Characterization group.    His technical area of expertise is in scanning probe microscopy where he established Dow's global AFM capability.  Greg was a co-principal investigator along with Dr. Craig Prater (formerly of Veeco, Inc.) on a 3year, $13MM joint NIST ATP project to develop quantitative nanomechanical measurements based on an atomic force microscopy platform.  He has also participated in the development of Bruker (Anasys Instruments) NanoIR platform (2010 R&D 100 winner).  He is the author or co-author of 1 textbook, 4 book chapters, 59 publications, and 2 patents. Greg obtained a BA degree in chemistry from Bowdoin College in 1979 and a PhD degree in inorganic chemistry from Texas A&M University in 1985.