AFM-IR overcomes the diffraction limitations of conventional infrared spectroscopy by using an AFM tip to detect the local infrared absorption. In this webinar, Dr. Greg Meyer from Dow Chemical explains the value of this capability for understanding polymers at the nanoscale. He presents four wide-ranging examples where AFM-IR was an essential tool in characterizing polymer systems.
This webinar discusses achieving molecular understanding of polymer systems using AFM-IR spectroscopy. AFM-IR is a technique that uses an atomic force microscope tip to detect the infrared absorption of a sample at the nanoscale.
The speaker, Greg Meyer from Dow Chemical, begins by discussing the limitations of conventional infrared spectroscopy due to diffraction. AFM-IR overcomes this by using an AFM tip to detect the local infrared absorption.
Dr. Meyer then presents several examples of using AFM-IR to characterize polymer materials, including:
In summary, AFM-IR provides chemical information about polymer systems at the nanoscale, revealing morphology, composition, and interfacial chemistry that cannot be accessed with conventional infrared spectroscopy. The technique works well for a wide range of polymer materials and applications.
Dr. Greg Meyers
Fellow, Core R&D - Analytical Science, The Dow Chemical Company, Midland, MI