In this webinar, our speakers draw from their research and experiences across a wide variety of disciplines to discuss the history of AFM-IR, examine recent advancements in AFM-IR capabilities, and explore a wide range of applications for this technique.
By combining infrared spectroscopy with atomic force microscopy (AFM-IR), it is possible to perform chemical analysis and compositional mapping with a spatial resolution down to 10 nanometers — significantly below standard optical diffraction limits.
Our speakers examine the origins of the AFM-IR technique, detail recent advancements, and explore a wide range of possible AFM-IR applications. These applications draw from their research and experiences across a wide variety of disciplines including materials science, life science, and astrochemistry. This workshop features talks on the use of AFM-IR to study:
Find out more information about Bruker's solutions for AFM-IR Spectroscopy:
Alexandre Dazzi, Université Paris-Saclay, Institut de Chimie Physique
Tom Vincent, the UK’s National Physical Laboratory (NPL) and Royal Holloway, University of London
Dr. Francesco Simone Ruggeri, Wageningen University
Dr. Suzanne Morsch, Research Fellow, AkzoNobel Laboratory for Corrosion Protection in the Department of Materials at the University of Manchester
Miriam Unger, Ph.D.
Applications Manager EMEA, NanoIR, Bruker Nano GmbH
Hartmut Stadler, Ph.D.
Applications Engineer, Bruker Nano GmbH