Join us for the launch of XTrace 2, the second-generation X-ray source used in our system for micro-XRF on SEM - QUANTAX micro-XRF.
Micro-XRF on SEM, also known as SEM XRF, provides scanning electron electron microscope users with additional analytical capabilities. Augmenting your SEM with QUANTAX micro-XRF allows users to go beyond the limits of the electron beam analysis used in SEM EDS, opening a whole new analytical world. Micro-XRF on SEM can be used for trace element detection, layer analysis and the detection of high-energy elemental lines, all with only minimal sample preparation.
In this webinar we will introduce you to our new X-ray source, XTrace 2, which takes the analytical capabilities of micro-XRF on SEM further than ever before. Equipped with a powerful 50 W micro-focus X-ray Rh tube, with 35 or 10 um optics, XTrace 2 can access high-energy elemental lines, providing more confidence in measurement and facilitating the detection of elements in crowded spectra.
XTrace 2 expands the capabilities of micro-XRF on SEM, allowing a wider variety of samples to be analysed. For example, the high-resolution imaging of topographic samples within a SEM is now possible thanks to XTrace 2's pioneering Aperture Management System (AMS) whereas the system's Flexispot Mode can be used to accurately measure inhomogeneous samples. In addition, the system can be automatically controlled via ESPRIT software with an Auto Source Retraction Mode providing an extra level of safety.
Join us in this webinar to explore the potential of micro-XRF on SEM with XTrace 2 across a range of different applications.
Dr. Andrew Menzies
Senior Application Scientist Geology and Mining, Bruker Nano Analytics
Product Manager micro-XRF on SEM and WDS, Bruker Nano Analytics
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