X-ray DIFFRACTION (XRD)

D8 ADVANCE ECO

Designed for the ecological and economical needs of today

The D8 ADVANCE ECO: A single solution for XRD, PDF and SAXS

1 kW
X-ray source power
High brilliance 1kW X-ray source for highest system efficiency at about only 50% energy consumption
0 Liters
Cooling water consumption
Efficient 1kW generator not requiring any external cooling: no need for external chiller or tap water
100% D8
The entire world of XRD
The D8 ADVANCE ECO is 100% compatible to the D8 ADVANCE thus offering the same range of X-ray applications at a minimum ecological footprint
Bruker’s unique alignment guarantee
Learn more

D8 ADVANCE ECO – XRD at a minimum ecological footprint

D8 ADVANCE ECO X-RAY DIFFRACTOMETER

The D8 ADVANCE ECO is a fully-featured D8 ADVANCE variant representing the entry point to the D8 diffractometer family platform. As the resources to procure and maintain X-ray analytics become increasingly limited, the requirements on accuracy, precision and speed are more demanding than ever.
The D8 ADVANCE ECO represents the ideal solution: Its minimum ecological footprint, ease of use, and outstanding analytical performance are the most prominent features. Various streamlined instrument configurations make the D8 ADVANCE ECO the perfect diffractometer for any budget level.

Like all other members of the D8 ADVANCE Family, the D8 ADVANCE ECO features all X-ray powder diffraction and scattering applications including

  • traditional X-ray powder diffraction (XRD)
  • Pair Distribution Function (PDF)analysis
  • Small and Wide Angle X-ray Scattering (SAXS, WAXS)

at ambient and non-ambient conditions.

The D8 ADVANCE ECO is fully compatible to the D8 ADVANCE and therefore offers all flexibility for the future. The instrument can be easily upgraded for new applications at any time, allowing you to accomodate any X-ray diffraction and scattering applications the future may bring.

Key Features

D8 ADVANCE ECO Features

ECOlogical

Featuring a high-brilliance 1kW line focus X-ray source the D8 ADVANCE ECO has very low energy consumption, does not require external water cooling and has no special requirements concerning lab infrastructure. All that is necessary is a simple domestic wall socket. Thus, the installation and positioning of the unit is easy and
flexible: Plug’n Analyze. The D8 ADVANCE ECO has a minimum cost of
ownership and the smallest ecological footprint of any floorstanding XRD instrument. All this is achieved without sacrificing analytical performance.

Plug'n Analyze:

  • No external water cooling required: Potentially saves up to 1.700 m3 tap water per year
  • About 50% less consumption of electrical energy
  • Only single phase power required
     
D8 ADVANCE ECO Features

ECOperformance

Being the most ECOlogical X-ray diffractometer on the market, the D8 ADVANCE ECO does not compromise on its performance in terms of range of applications, data quality, flexibility, and upgradeability.

The D8 ADVANCE ECO is a fully-featured D8 ADVANCE variant for all X-ray powder diffraction and scattering applications. Being fully compatible to the D8 ADVANCE, it offers all flexibility for the future. The D8 ADVANCE ECO can be easily upgraded for new applications at any time, allowing you to accomodate any X-ray diffraction and scattering applications the future may bring to your lab:

  • Phase identification
  • Quantitative phase analysis
  • Microstructure analysis
  • Structure determination and refinement
  • Residual stress
  • Texture
  • Grazing Incidence Diffraction (GID)
  • X-ray Reflectometry (XRR)
  • Small Angle X-ray Scattering (SAXS)
  • Pair Distribution Function (PDF) analysis
D8 ADVANCE ECO Features

ECOnomical

The D8 ADVANCE ECO line features high-end performance using instrument configurations for any budget level. Its operational expenses are significantly lowered due to reduced need for resources such as water and electrical power. Reliability is assured with superior instrument quality, and backed up with unrivaled component guarantees.

  • Zero cost for external water
  • Significantly reduced cost for power due to an efficient 1kW generator and no power for an external chiller
  • Significantly extended X-ray tube lifetime
  • X-ray tube guarantee: All high-brilliance X-ray sources available for the D8 ADVANCE ECO come with a 3-year warranty
  • Goniometer guarantee: The robust and maintenance-free design of the goniometer provides maximum mechanical strength, long life, and thus superior data quality. This includes an outstanding 10-year warranty
  • Instrument alignment guarantee
  • Detector guarantee

One Diffractometer - All Applications

D8 ADVANCE ECO Applications

Powder Diffraction

X-ray powder diffraction (XRPD) techniques are among the most important tools for materials characterization. Much of the information embedded in a powder pattern is derived directly from the atomic arrangement of the phases present. The D8 ADVANCE ECO and the DIFFRAC.SUITE software support simple execution of common XRPD methods:

  • Identification of both crystalline and amorphous phases and determination of specimen purity
  • Quantitative analysis of both crystalline and amorphous phases in multi-phase mixtures
  • Microstructure analysis (crystallite size, microstrain, disorder…)
  • Bulk residual stress resulting from thermal treatment or machining in manufactured components
  • Texture (preferred orientation) analysis
  • Indexing, ab-initio crystal structure determination and crystal structure refinement
D8 ADVANCE ECO Applications

Pair Distribution Function Analysis

Pair distribution function (PDF) analysis is an analytical technique that provides structural information from disordered materials based on Bragg as well as diffuse scattering ("Total Scattering"). While Bragg peaks provide information about the average crystal structure of a material (i.e. long range order), diffuse scattering allows characterization of its local structure (i.e. short range order).
The D8 ADVANCE ECO and TOPAS software represent the highest performing PDF analysis solutions on the market in terms of analysis speed, data quality and results for analysis of amorphous, poorly crystalline, nano-crystalline or nano-structured materials:

  • Phase identification
  • Structure determination and refinement
  • Nano particle size and shape
D8 ADVANCE ECO Applications

Thin Films and Coatings

Analysis of thin films and coatings is based on the same principles of XRPD, but with further beam conditioning and angular control. Typical examples include, but are not limited to, phase identification, crystalline quality, residual stress, texture analysis, thickness determination and composition vs strain analysis. Analysis of thin films and coatings is focusing on properties of layered materials with nm to µm thickness, ranging from amorphous and poly-crystalline coatings to epitaxially grown films. The D8 ADVANCE ECO and the DIFFRAC.SUITE software enable high quality analyses of thin films including:

  • Grazing Incidence Diffraction
  • X-Ray Reflectometry
  • High Resolution X-ray Diffraction
  • Reciprocal Space Mapping

D8 ADVANCE ECO Specifications

Feature


Specification

Benefit

ECO

Minimum cost of ownership

Plug’n Analyze: No special needs concerning lab infrastructure

No external water cooling required

1kW X-ray source power

Only a simple domestic wall socket is required (single phase power). Thus, the installation and positioning of the unit is easy and flexible

The smallest ecological footprint of any floorstanding XRD instrument

Potentially saves up to 1.700 m³ tap water per year

About 50% less consumption of electrical energy

TRIO and TWIN optics

Software push-button switch between:

Motorized Divergence Slit (Bragg-Brentano)

High Intensity Ka1,2 Parallel Beam

High Resolution Ka1 Parallel Beam

Patents: US10429326, US6665372, US7983389

Fully automatic, motorized switching between up to 6 different beam geometries without any manual  user intervention

Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial)

Dynamic Beam Optimization

Dynamic synchronization of:

motorized divergence slits

motorized anti-scatter screen

variable active detector window

2Theta Angular range: <1 to >150

Data virtually free of air, instrument, and sample support scattering

Significantly enhanced lower limits of detection enabling quantification for minor crystalline and amorphous phases

Unparalleled performance at low 2Theta angles enabling accurate investigations of clays, pharmaceuticals, zeolites, porous framework materials and more

LYNXEYE XE-T

Energy Resolution: < 380 eV @ 8 KeV

Detection Modes: 0D,1D, 2D

Wavelengths: Cr, Co, Cu, Mo and Ag

Patents: EP1647840, EP1510811, US20200033275

No need for Kß filters and secondary monochromators

100% filtering of Fe-fluorescense with Cu radiation

Up to 450 times faster than conventional detector systems

BRAGG2D: Collect 2D data with a divergent primary line beam

Unique detector warranty: No defective channels at delivery time

EIGER2 R

The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd.

Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes

Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage

Panoramic, tool-free diffracted beam optics using the complete detector field of view

Continuously variable detector positioning to balance angular coverage and resolution

TWIST.TUBE

Easy, fast, and alignment-free switch between line and point focus applications

No disconnecting of electric cables or water hoses or unmounting of tubes

DAVINCI.DESIGN: Fully automatic detection and configuration of the focus orientation

Sample Changers

FLIPSTICK: 9 Samples

AUTOCHANGER: 90 samples

Operation in reflection AND transmission geometries

D8 Goniometer

Two-circle goniometer with independent stepper motors and optical encoders

Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee

Absolutely maintenance free drive mechanism / gearings with lifetime lubrication

Non-ambient

Temperature: Ranging from ~85K up to ~1800K

Pressure: 10-⁴ mbar up to 1 bar

Humidity: 5% to 95% RH

Investigations under ambient and non-ambient conditions

Easily exchanged stages with DIFFRAC.DAVINCI

XRD Components

XRD Components

Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.

All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.

Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.

PLAN.MEASURE.ANALYZE with DIFFRAC.SUITE

DIFFRAC.SUITE Software

DIFFRAC.SUITE™ offers a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of modern software technology for stability, maximum ease of use and networking.

The fully customizable user-interface is characterized by a plug-in framework, providing a common look, feel and operation. All measurement and evaluation software modules can be operated as individual applications or integrated together in DIFFRAC.SUITE's plug-in framework. Unlimited networking allows access and control of any number of D2 PHASER, D8 ADVANCE, D8 DISCOVER and D8 ENDEAVOR diffractometers within a customer's network.

Measurement Software:
WIZARD – Method planning
COMMANDER – Method execution and direct measurements
TOOLS – Service Interface
Powder Diffraction Software:
DQUANT – Quantitative phase analysis
EVA – Phase identification and quantitative phase analysis
TOPAS – Profile analysis, quantitative analysis, structure analysis

Materials Research Software:
SAXS – Small Angle X-ray Scattering software
XRR – Comprehensive X-ray reflectometry analysis
TEXTURE – All-round Texture analysis meets ease-of-use
LEPTOS – Thin film analysis/Residual stress investigation

Service & Support

Contact