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In-situ Nanomechanical Testing

Rotation and Tilt Stage of Hysitron PI 89

Enabling imaging, FIB milling, and access to detectors, such as EDS, CBD, EBSD, and TKD for analytical data and imaging

Two Configurations

Configuration A (Standard): ​

  • Rotation perpendicular to the indentation axis​ - Optimized for traditional EBSD, FIB milling, and top-down imaging​

Configuration B (Spindle):​

  • Rotation parallel to the indentation axis​ - Optimized for live EBSD, TKD, STEM​
  • Leverage your microscope by combining nanomechanics with multiple detectors and viewing angles.​
  • Reduce sample handling and exposure by FIB machining and testing under vacuum​
  • Tilt Range: 180°, Accuracy: 0.33°​
  • Rotation Range: 180°, Accuracy: 0.18°

Configuration A (Standard):

The Hysitron PI 89 equipped with the optional tilt and rotation stages features flexible sample positioning with five degrees of freedom (X, Y, Z, tilt, rotation) giving the user the ability to align the sample with an ion beam for sample preparation or with detectors such as EBSD, EDS, or WDS to obtain a deeper understanding of the material’s mechanical response.

Indentation and EBSD mapping of phases of duplex steel.

Configuration B (Spindle):

  • Rotation parallel to the indentation axis​
  • Optimized for live EBSD, TKD, STEM


 

Particle compression and in-situ FIB milling.