NanoIR Through Peak Force Infrared (PFIR) Microscopy
Learn how researchers at Lehigh University use PFIR—a novel AFM-IR method based on Bruker's PeakForce Tapping mode.
In this demonstration, the presenter introduces the PFIR method of AFM-IR, a novel approach to label-free chemical nanoscopy based on the mechanical detection of photothermal response by AFM operated in PeakForce Tapping mode developed at Lehigh University. In addition to providing a review of the strengths and benefits of PFIR as they relate to foundational AFM-IR and PeakForce Tapping principles and capabilities, the presentation explores and provides detailed, real-world examples of its applicability to a broad range of sample types and experimental settings.
As a result, PFIR achieves a higher spatial resolution (sub-10 nm) and provides more rich chemical information than many of the existing tools we use for chemical imaging—or imaging in general—while also providing greater flexibility in applicability to samples in both air and liquid.
