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On-Demand Session | 20 Minutes

NanoIR Through Peak Force Infrared (PFIR) Microscopy

presented by by Xiaoji Xu, Ph.D. (Lehigh University)

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Watch this exclusive presentation by Xiaoji Xu, Ph.D. (Lehigh University) about the novel Peak Force Infrared microscopy technique. Submit the form for instant, full-length access.

 

Learn how leading researchers reveal previously inaccessible information with PFIR—a novel AFM-IR method based on Bruker's PeakForce Tapping mode.

  • Gain new insight into the strengths and functional limits of photothermal AFM-IR and complementary PeakForce QNM-based modulus and adhesion mapping.
  • Learn about the development and practical applications of the novel peak force infrared microscopy (PFIR) method.
  • Understand the benefits and novel uses of PFIR for hard/rough samples, soft samples, and aerosols.
  • Explore specialized PFIR modes including multi-pulse PFIR, PFIR with pump/probe geometry, and liquid-phase PFIR.
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Learn how researchers at Lehigh University use PFIR—a novel AFM-IR method based on Bruker's PeakForce Tapping mode.

In this demonstration, the presenter introduces the PFIR method of AFM-IR, a novel approach to label-free chemical nanoscopy based on the mechanical detection of photothermal response by AFM operated in PeakForce Tapping mode developed at Lehigh University. In addition to providing a review of the strengths and benefits of PFIR as they relate to foundational AFM-IR and PeakForce Tapping principles and capabilities, the presentation explores and provides detailed, real-world examples of its applicability to a broad range of sample types and experimental settings.

As a result, PFIR achieves a higher spatial resolution (sub-10 nm) and provides more rich chemical information than many of the existing tools we use for chemical imaging—or imaging in general—while also providing greater flexibility in applicability to samples in both air and liquid.