Full-surface of the SiC wafer
Crystalline polymorph Raman imaging
RAMANdrive performs full-surface Raman imaging
With Raman spectroscopy you can simply identify SiC wafers with its several crystalline polymorphs. By enabling high-resolution, full-surface, and 3D imaging, The RAMANdrive allows for precise identification and visualization of different polytypes and their distribution.
Learn more about performing full-surface Raman imaging using our RAMANdrive in our Application Note.
