Featuring a panel of Bruker application experts, the recording includes presentations and live technical demonstrations highlighting the features, capabilities, and practical use of Bruker's tools and techniques for nanoscale polymer property measurement.
Presentations topics includes:
Attendees of this virtual Surface Lab session can expect to explore a range of these characterization techniques as they are used by leading researchers in the field of polymer research.
With welcome address, introduction, live audience Q&A, and closing remarks by Dr. Peter De Wolf, Worldwide Application Director, Bruker
When studying polymeric materials, AFM has many benefits over alternative techniques.
Several different AFM methods for measuring the properties of polymers will be covered, from high resolution elastic & viscoelastic mechanical property mapping to nano-electrical and temperature dependent measurements.
Combining IR spectroscopy with the high-resolution imaging capabilities of AFM enables the chemical characterization of polymeric materials. We will provide insights into new and existing photothermal AFM-IR techniques and demonstrate how to achieve high performance results.
Nano-mechanical characterization can also be achieved using nano-indentation methods.
Peter Dewolf, Ph.D.
Worldwide Application Director, Bruker Nano Surfaces & Metrology
Mickael Febvre, Ph.D.
Application Manager, Bruker EMEA
Miriam Unger, Ph.D.
Applications Manager EMEA, NanoIR, Bruker Nano GmbH
Hartmut Stadler, Ph.D., Application Scientist, Bruker
Heiko Haschke, Ph.D., Application Scientist, Bruker
Thomas Henze, Ph.D., BioAFM Application Scientist, Bruker
Ude Hangen, Ph.D.
Applications Manager, Bruker EMEA
Jaroslav Lukes, Ph.D., Applications Scientist, Bruker