Nanoindentation techniques have long had an important role in quantitatively evaluating the mechanical properties of microstructural features. In recent years, high speed nanoindentation mapping techniques have been under development and have recently achieved speeds up to 6 indents/second, approximately 500x faster than traditional nanoindentation mapping methodologies. This enables a one-to-one correlation with other techniques, such as EBSD, and provides corresponding large data sets for robust statistical analysis. This correlation can produce high resolution structure-property relationships which can be mapped over sub-micron to several hundreds of micron length scales.
In this webinar, Dr. Eric Hintsala (Bruker) discusses the technology behind XPM (high speed nanoindentation) and the numerous potential applications, from evaluation of microstructure-property evolution during processing, quality control testing of weld zones, evaluation of sub-surface damage gradients (wear, corrosion, irradiation), composite material interfaces, and more.
In this webinar, Dr. Hintsala discusses:
Additional information about XPM:
High-Throughput Nanoindentation for Statistical and Spatial Property Determination
Dr. Eric Hintsala
Applications Scientist