Stylus and Optical Profilometry Webinars

Optical Profiler Characterization of Advanced Materials Using White Light Interferometry

Learn how today's advanced optical profilers can provide rapid and highly accurate characterization solutions for materials research and development


WLI-based characterization techniques are driving innovation in materials research and development.

This webinar provides a comprehensive exploration of white light interferometry (WLI)-based advanced materials characterization, including techniques, practical considerations, and regulatory standards for such concepts as waviness, roughness, and spatial filtering.


Find out more about the technology featured in this webinar or our other solutions for advanced materials characterization.

Recorded on September 22, 2020

Explore Fast, Accurate Techniques for Advanced Materials Characterization

Tackling global challenges often requires the development of new, increasingly advanced materials; these support efforts to build a neutral carbon dioxide economy, improve energy efficiency, develop high bandwidth communication, and identify better methods for preventing and fighting pandemics, among others.

Yet new materials development evolves quickly, driven by innovation in the capabilities and capacity of R&D equipment and processes. As a result, dedicated, high-performance characterization tools are increasingly important in a wide range of fields ranging from geology to optoelectronics.

 

Geared toward materials scientists, bio-mechanical researchers, geology & nuclear waste researchers, materials development researchers & engineers, and waveguide optical developers, this webinar includes:

  • A comprehensive explanation of roughness considerations like waviness, roughness and spatial filtering;
  • Steps for the ISO-compliant set up and post-processing analyses of mean roughness measurements;
  • An exploration of both profile and areal based measurements, with emphasis on their differences; and
  • Practical examples from experts in the field.

Speakers

Samuel Lesko, Ph.D.
Dir. of Technology and Apps Development for Tribology, Stylus & Optical Profilers, Bruker

 

Samuel has Ph.D. and engineering degrees in material science from the University of Burgundy in France. Since 2000, he has built extensive experience in optical profiling technology, particularly in using white light interferometry applied to MEMS, semiconductor, automotive and aerospace applications. His vast experience and passion in correlating roughness parameters with the performance of devices or parts has aided countless researchers and engineers in both academic and industrial settings.

Dr. Alexander Nesterov-Mueller

KIT, Institute of Microstructure Technology, Germany

Dr. Andreas Luttge

MARUM, University of Bremen, Germany