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Optical Profiler Characterization of Advanced Materials Using White Light Interferometry

Learn how today's advanced optical profilers can provide rapid and highly accurate characterization solutions for materials research and development

Research and development innovations are critical to tackle global challenges such as neutral carbon dioxide economy, higher energy efficiency, high bandwidth communication, and pandemic fighting. New materials research quickly evolves in a wide range of fields, from geology to opto-electronic, requiring dedicated and high-performance characterization tools.

This webinar provides a comprehensive explanation of roughness considerations, including such key concepts as waviness, roughness and spatial filtering. You will learn how to properly set up measurements and subsequent post-processing analyses to comply with ISO standards for mean roughness. Both profile and areal based measurements are described, with emphasis on their differences. Practical examples based on 3D optical profiler and roughness standards are also covered.

Who Should Attend

  • Materials scientists
  • Bio-mechanical researchers
  • Geology & nuclear waste researchers
  • Materials development researchers & engineers
  • Waveguide optical developers

Speakers

Samuel Lesko

Bruker (USA)

Senior Application Development Manager

Samuel has Ph.D. and engineering degree in material science from the University of Burgundy in France. Since 2000, he built extensive experience in optical profiler, particularly in using white light interferometry applied to MEMS, semiconductor, automotive and aerospace. His vast experience and passion in correlating roughness parameters with the performance of devices or parts has aided countless researchers and engineers in both academic and industrial settings

Dr. Alexander Nesterov-Mueller

KIT, Institute of Microstructure Technology, Germany

Dr. Andreas Luttge

MARUM, University of Bremen, Germany