Stylus and Optical Profilometry Webinars

Measuring Profile and Real Mean Roughness with 3D WLI Profilers

Discover the practical differences between stylus and areal methods of assessing mean roughness (Sa vs Ra), as well as the key considerations necessary for choosing and using both


Production of next-generation materials and the ability to manufacture them at scale both rely on fast, accurate mean surface roughness evaluation.

This webinar focuses on the practical impacts and differences between stylus and areal methods of assessing mean roughness (Ra), as well as the key considerations necessary for determining the most appropriate applications for either method.


Find out more about the technology featured in this webinar or our other solutions for surface texture characterization:

Recorded on April 06, 2020

Assess Mean Surface Roughness by Profile and Areal Methods

Stylus-based profiles have long been used to capture mean roughness (Ra) and to assess product and process quality. However, modern engineering and manufacturing often generate random and/or complex engineered surface textures that are difficult to assess with a single-line profile.

Consequently, though mean roughness can easily be captured through one—or a few—profiles for standard manufacturing processes (those which leave a single texture orientation), optical areal measurement becomes mandatory to properly evaluate the surface in many cases.

This webinar aims to provide both theoretical background and practical measurement considerations (including filter selection, measurement setup, and data processing) for measuring profile and real mean roughness using Bruker's Stylus and Optical profilometry solutions, highlighting the ways that both profile and areal methods are able to co-exist in modern industry.

Speakers

Samuel Lesko, Ph.D.
Dir. of Technology and Apps Development for Tribology, Stylus & Optical Profilers, Bruker

 

Samuel Lesko has over 20 years of optical and stylus profiler applications experience, particularly in using white-light interferometry in a wide variety of fields, from MEMS and semiconductor to automotive and aerospace. He is a member of SME and part of ISO/TC 213/WG committee (areal roughness) and obtained his physics Ph.D. and material science engineering degree at the University of Burgundy in France.

Ian Armstrong, Ph.D.
North America Application Manager, Bruker

Ian Armstrong is an application manager at Bruker Nano Surfaces and Metrology division and has over 13 years of industrial experience. Formerly he was one of the application team covering AFM and stylus and optical profilometry. Previous to Bruker he obtained a Ph.D. from Swansea University in the UK where his thesis largely involved using AFM.

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