WLI Optical Profiler: Measuring Profile and Real Mean Roughness with 3D Profilers
Discover the basis of roughness and associated ISO norms to measure Ra & Sa parameters.
This webinar provides a comprehensive explanation of roughness considerations, including such key concepts as waviness, roughness and spatial filtering. You will learn how to properly set up measurements and subsequent post-processing analyses to comply with ISO standards for mean roughness. Both profile and areal based measurements are described, with emphasis on their differences. Practical examples based on 3D optical profiler and roughness standards are also covered.
Speakers
Samuel Lesko
Bruker (USA)
Senior Application Development Manager
Dr. Ian Armstrong
Sales Application Manager NA
