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WLI Optical Profiler: Measuring Profile and Real Mean Roughness with 3D Profilers

Discover the basis of roughness and associated ISO norms to measure Ra & Sa parameters.

This webinar provides a comprehensive explanation of roughness considerations, including such key concepts as waviness, roughness and spatial filtering. You will learn how to properly set up measurements and subsequent post-processing analyses to comply with ISO standards for mean roughness. Both profile and areal based measurements are described, with emphasis on their differences. Practical examples based on 3D optical profiler and roughness standards are also covered.

Speakers

Samuel Lesko

Bruker (USA)

Senior Application Development Manager

Samuel has Ph.D. and engineering degree in material science from the University of Burgundy in France. Since 2000, he built extensive experience in optical profiler, particularly in using white light interferometry applied to MEMS, semiconductor, automotive and aerospace. His vast experience and passion in correlating roughness parameters with the performance of devices or parts has aided countless researchers and engineers in both academic and industrial settings

Dr. Ian Armstrong

Sales Application Manager NA