WLI Optical Profiler: Measuring Profile and Real Mean Roughness with 3D Profilers

Discover the basis of roughness and associated ISO norms to measure Ra & Sa parameters.

This webinar provides a comprehensive explanation of roughness considerations, including such key concepts as waviness, roughness and spatial filtering. You will learn how to properly set up measurements and subsequent post-processing analyses to comply with ISO standards for mean roughness. Both profile and areal based measurements are described, with emphasis on their differences. Practical examples based on 3D optical profiler and roughness standards are also covered.

Speakers

Samuel Lesko

Bruker (USA)

Senior Application Development Manager

Samuel has Ph.D. and engineering degrees in material science from the University of Burgundy in France. Since 2000, he has built extensive experience in optical profiling technology, particularly in using white light interferometry applied to MEMS, semiconductor, automotive and aerospace applications. His vast experience and passion in correlating roughness parameters with the performance of devices or parts has aided countless researchers and engineers in both academic and industrial settings.

Ian Armstrong, Ph.D., North America Application Manager, Bruker

Ian Armstrong is an application manager at Bruker Nano Surfaces and Metrology division and has over 13 years of industrial experience. Formerly he was one of the application team covering AFM and stylus and optical profilometry. Previous to Bruker he obtained a Ph.D. from Swansea University in the UK where his thesis largely involved using AFM.