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▶ Watch On-Demand | 49 minutes

On-Demand Session: AFM Probes: From Fabrication to Functionality

AFM Probes: From Fabrication to Functionality
Watch Now | 38 Minutes

AFM Probes: From Fabrication to Functionality

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Presented by Ian Armstrong, Ph.D., Senior Manager AFM Probes, Bruker (May 8, 2025)

       PRESENTATION HIGHLIGHTS:

  • [00:02:00] AFM probe life cycle
  • [00:06:10] Si and SiN Probes
  • [00:09:07] Uncoated probes for tapping and contact mode
  • [00:10:46] Reflex coatings for improved photodetector signal, low interference
  • [00:12:54] Frontside/ tip coating for functional measurements
  • [00:18:10] Vibrometer spring constant calculation
  • [00:21:00] Tip ROC SEM
  • [00:23:03] Further tip processes
  • [00:25:52] Focus Ion beam milled tips
  • [00:28:16] Electron beam deposited tips
  • [00:32:04] Probes for niche applications
Watch Now | 11 Minutes

Q&A 

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       PRESENTATION HIGHLIGHTS:

  • [00:00:00] What is the difference between metal evaporators and sputtering tools?
  • [00:02:24] Can you elaborate on the gelpacks' contamination concerns?
  • [00:05:19] Does the Pick and place system have a vacuum?
  • [00:06:38] Are high-aspect ratio tips able to image in liquid? How fast can you scan?
  • [00:08:54] How do you measure probe lifetime?

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