On-Demand Session: AFM Probes: From Fabrication to Functionality
AFM Probes: From Fabrication to Functionality
AFM Probes: From Fabrication to Functionality
PRESENTATION HIGHLIGHTS:
- [00:02:00] AFM probe life cycle
- [00:06:10] Si and SiN Probes
- [00:09:07] Uncoated probes for tapping and contact mode
- [00:10:46] Reflex coatings for improved photodetector signal, low interference
- [00:12:54] Frontside/ tip coating for functional measurements
- [00:18:10] Vibrometer spring constant calculation
- [00:21:00] Tip ROC SEM
- [00:23:03] Further tip processes
- [00:25:52] Focus Ion beam milled tips
- [00:28:16] Electron beam deposited tips
- [00:32:04] Probes for niche applications
Q&A
PRESENTATION HIGHLIGHTS:
- [00:00:00] What is the difference between metal evaporators and sputtering tools?
- [00:02:24] Can you elaborate on the gelpacks' contamination concerns?
- [00:05:19] Does the Pick and place system have a vacuum?
- [00:06:38] Are high-aspect ratio tips able to image in liquid? How fast can you scan?
- [00:08:54] How do you measure probe lifetime?
